Zobrazeno 1 - 10
of 120
pro vyhledávání: '"Hyun Choe"'
Publikováno v:
npj Clean Water, Vol 7, Iss 1, Pp 1-6 (2024)
Abstract This study presents a novel analytical method for the quantitative and qualitative analysis of microplastics (MPs) in deionized (DI) water using Raman spectroscopy. Raman peak area ratios of 1295 cm−1 for polyethylene (PE) and 637 cm−1 f
Externí odkaz:
https://doaj.org/article/788c2419c2a449428f0b59db36f4abb6
Autor:
Atif Jan, Stephanie A. Fraser, Taehwan Moon, Yun Seong Lee, Hagyoul Bae, Hyun Jae Lee, Duk‐Hyun Choe, Maximilian T. Becker, Judith L. MacManus‐Driscoll, Jinseong Heo, Giuliana Di Martino
Publikováno v:
Small Science, Vol 4, Iss 11, Pp n/a-n/a (2024)
Ferroelectric HfO2‐based films incorporated in nonvolatile memory devices offer a low‐energy, high‐speed alternative to conventional memory systems. Oxygen vacancies have been rigorously cited in literature to be pivotal in stabilizing the pola
Externí odkaz:
https://doaj.org/article/37d2306da33842e6a1d3cadab241fffe
Publikováno v:
In Applied Surface Science 15 March 2023 613
Autor:
José P. B. Silva, Ruben Alcala, Uygar E. Avci, Nick Barrett, Laura Bégon-Lours, Mattias Borg, Seungyong Byun, Sou-Chi Chang, Sang-Wook Cheong, Duk-Hyun Choe, Jean Coignus, Veeresh Deshpande, Athanasios Dimoulas, Catherine Dubourdieu, Ignasi Fina, Hiroshi Funakubo, Laurent Grenouillet, Alexei Gruverman, Jinseong Heo, Michael Hoffmann, H. Alex Hsain, Fei-Ting Huang, Cheol Seong Hwang, Jorge Íñiguez, Jacob L. Jones, Ilya V. Karpov, Alfred Kersch, Taegyu Kwon, Suzanne Lancaster, Maximilian Lederer, Younghwan Lee, Patrick D. Lomenzo, Lane W. Martin, Simon Martin, Shinji Migita, Thomas Mikolajick, Beatriz Noheda, Min Hyuk Park, Karin M. Rabe, Sayeef Salahuddin, Florencio Sánchez, Konrad Seidel, Takao Shimizu, Takahisa Shiraishi, Stefan Slesazeck, Akira Toriumi, Hiroshi Uchida, Bertrand Vilquin, Xianghan Xu, Kun Hee Ye, Uwe Schroeder
Publikováno v:
APL Materials, Vol 11, Iss 8, Pp 089201-089201-70 (2023)
Ferroelectric hafnium and zirconium oxides have undergone rapid scientific development over the last decade, pushing them to the forefront of ultralow-power electronic systems. Maximizing the potential application in memory devices or supercapacitors
Externí odkaz:
https://doaj.org/article/bdc8e7ac6d8a4918bcd408390bfda1b5
Autor:
Taehwan Moon, Hyun Jae Lee, Seunggeol Nam, Hagyoul Bae, Duk-Hyun Choe, Sanghyun Jo, Yun Seong Lee, Yoonsang Park, J Joshua Yang, Jinseong Heo
Publikováno v:
Neuromorphic Computing and Engineering, Vol 3, Iss 2, p 024001 (2023)
We propose a novel synaptic design of more efficient neuromorphic edge-computing with substantially improved linearity and extremely low variability. Specifically, a parallel arrangement of ferroelectric tunnel junctions (FTJ) with an incremental pul
Externí odkaz:
https://doaj.org/article/db5675976ec94bde8fc43525d5ede6de
Autor:
Ji-Hee Kim, Matthew R. Bergren, Jin Cheol Park, Subash Adhikari, Michael Lorke, Thomas Frauenheim, Duk-Hyun Choe, Beom Kim, Hyunyong Choi, Tom Gregorkiewicz, Young Hee Lee
Publikováno v:
Nature Communications, Vol 10, Iss 1, Pp 1-9 (2019)
During carrier multiplication, high-energy free carriers in a given material relax by generation of additional electron-hole pairs. Here, the authors report evidence of carrier multiplication in multilayer MoTe2 and WSe2 films with up to 99% conversa
Externí odkaz:
https://doaj.org/article/0aa0200a81034578b05965a772f1e877
Autor:
Sanghyun Jo, Hyangsook Lee, Duk-Hyun Choe, Jung-Hwa Kim, Yun Seong Lee, Owoong Kwon, Seunggeol Nam, Yoonsang Park, Kihong Kim, Byeong Gyu Chae, Sangwook Kim, Seunghun Kang, Taehwan Moon, Hagyoul Bae, Jung Yeon Won, Dong-Jin Yun, Myoungho Jeong, Hyun Hwi Lee, Yeonchoo Cho, Kwang-Hee Lee, Hyun Jae Lee, Sangjun Lee, Kab-Jin Nam, Dongjin Jung, Bong Jin Kuh, Daewon Ha, Yongsung Kim, Seongjun Park, Yunseok Kim, Eunha Lee, Jinseong Heo
Publikováno v:
Nature Electronics. 6:390-397
Autor:
Ho Jae Shim, Jin Seok Kim, Da Won Ahn, Jin Hyun Choe, Eunsu Jung, Donghyuk Oh, Kyung Soo Kim, Sung Chul Lee, Sung Gyu Pyo
Publikováno v:
Electronic Materials Letters. 18:321-329
Publikováno v:
Electronic Materials Letters.
Publikováno v:
Electronic Materials Letters.