Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Hyeongwon Seo"'
Autor:
Justin Im, Raphaël Rakotozandrindrainy, Ursula Panzner, Leon Parfait Kabore, Enusa Ramani, Ondari D. Mogeni, Ellis Owusu-Dabo, William MacWright, Ligia Maria Cruz Espinoza, Nimesh Poudyal, Vittal Mogasale, Florian Marks, Oluwafemi Popoola, Yaw Adu-Sarkodie, Andrea Haselbeck, Mekonnen Teferi, Heidi Schütt-Gerowitt, Calman A. MacLennan, Gi Deok Pak, Sean C. Elias, Octavie Lunguya Metila, Keriann Conway Roy, Isaac Osei, John A. Crump, Se Eun Park, Michael Owusu, Ayan Dey, Christopher M. Parry, Eric D. Mintz, Aderemi Kehinde, Ju Yeong Park, Stephen Baker, Hyon Jin Jeon, Jan Jacobs, Jong-Hoon Kim, Trevor Toy, John D. Clemens, Iruka N. Okeke, Yun Chon, Hye Jin Seo, Christian Meyer, Abdramane Bassiahi Soura, Robert F. Breiman, Hyeongwon Seo
Publikováno v:
CLINICAL INFECTIOUS DISEASES
Clinical Infectious Diseases: An Official Publication of the Infectious Diseases Society of America
Clinical Infectious Diseases: An Official Publication of the Infectious Diseases Society of America
Background Invasive salmonellosis is a common community-acquired bacteremia in persons residing in sub-Saharan Africa. However, there is a paucity of data on severe typhoid fever and its associated acute and chronic host immune response and carriage.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::39115c82e73471a2e6787d66bb72bb67
Autor:
Mekonnen Teferi, Enusa Ramani, Abdramane Bassiahi Soura, Gi Deok Pak, Vittal Mogasale, Seeun Park, Isaac Osei, Ligia Maria Cruz Espinoza, Ellis Owusu-Dabo, Yun Chon, Justin Im, Ondari D. Mogeni, Hyeongwon Seo, Raphaël Rakotozandrindrainy, Hyon Jin Jeon, Ursula Panzner, Florian Marks, Trevor Toy
Publikováno v:
Clinical Infectious Diseases: An Official Publication of the Infectious Diseases Society of America
Background There are limited data on typhoid fever cost of illness (COI) and economic impact from Africa. Health economic data are essential for measuring the cost-effectiveness of vaccination or other disease control interventions. Here, we describe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1151b51448f3f8550b3dc6aff7fe3459
https://pubmed.ncbi.nlm.nih.gov/31665774
https://pubmed.ncbi.nlm.nih.gov/31665774
Autor:
Jeong-Hoon Oh, Hyoungsun Hong, Yonghan Roh, Ilgweon Kim, Hyeongwon Seo, Segeun Park, Gyo-Young Jin
Publikováno v:
IEEE Electron Device Letters. 37:859-861
We clarify the role of metal gates (e.g., TiN) on the degradation of the state-of-the-art buried-channel-array transistor (B-CAT) in dynamic random access memory (DRAM) chips. Unless the thermal budget during the processing step for integration is we
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c73d79f9beabbd0efb3f53c29854fdd4
https://doi.org/10.1109/led.2016.2563159
https://doi.org/10.1109/led.2016.2563159