Zobrazeno 1 - 10
of 42
pro vyhledávání: '"Hyeon-Gu Jeon"'
Publikováno v:
IEEJ Transactions on Fundamentals and Materials. 143:166-172
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4930dff60dd50a7fc0f9a6ae46c43c64
https://doi.org/10.1541/ieejfms.143.166
https://doi.org/10.1541/ieejfms.143.166
Publikováno v:
IEEJ Transactions on Fundamentals and Materials. 140:325-330
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fb6e7d3bb0050c2b81eb469da143307b
https://doi.org/10.1541/ieejfms.140.325
https://doi.org/10.1541/ieejfms.140.325
Publikováno v:
Japanese Journal of Applied Physics. 61:121001
Fabrication of nanoparticle colloids of organic semiconductors is a fascinating subject not only because of its unique properties from the size-effects but also because of its practical advantage of low manufacturing cost for various electronic devic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4593282725520c919c18b1f1a402706b
https://doi.org/10.35848/1347-4065/ac9d13
https://doi.org/10.35848/1347-4065/ac9d13
Publikováno v:
Journal of the Korea Institute of Information Security and Cryptology. 27:59-66
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::08280a9b4d2202d4ad7d535c26e6dca5
https://doi.org/10.13089/jkiisc.2017.27.1.59
https://doi.org/10.13089/jkiisc.2017.27.1.59
Publikováno v:
IEEJ Transactions on Fundamentals and Materials. 137:215-220
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ea3c435f1d9d41ccf3a8017741ce2534
https://doi.org/10.1541/ieejfms.137.215
https://doi.org/10.1541/ieejfms.137.215
Publikováno v:
Surface and Interface Analysis. 49:522-526
Ultra-thin HfO2 films of 3.5, 5.0, and 8.0 nm nominal thicknesses were prepared, respectively, on silicon substrates by using atomic layer deposition method. Through the analyses of X-ray reflectometry (XRR), X-ray photoelectron spectroscopy, and tra
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7b80e46f9358facc5c2f490bc509b643
https://doi.org/10.1002/sia.6188
https://doi.org/10.1002/sia.6188
Publikováno v:
KIISE Transactions on Computing Practices. 22:178-183
To enhance the reliability of programs, developers use fuzzing tools in test processes to identify vulnerabilities so that they can be fixed ahead of time. In this case, the developers consider the security-related vulnerabilities to be the most crit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a14b691fd27444d2324341d02a805369
https://doi.org/10.5626/ktcp.2016.22.4.178
https://doi.org/10.5626/ktcp.2016.22.4.178
Publikováno v:
COMPSAC (1)
This paper introduces a static binary analysis tool called CrashFilter, which classifies the crashes arisen during the test, according to the risk levels. It has advantages in accuracy and provides wider coverage of analysis, due to newly introduced
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::45c10d01c268931f2e349965d42d6b08
https://doi.org/10.1109/compsac.2017.70
https://doi.org/10.1109/compsac.2017.70
Publikováno v:
IEEJ Transactions on Industry Applications. 138:758-759
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a58b094180083c507515ab9299a4bc02
https://doi.org/10.1541/ieejias.138.758
https://doi.org/10.1541/ieejias.138.758
Publikováno v:
Journal of Applied Physics; Aug2010, Vol. 108 Issue 3, p034502, 5p, 2 Diagrams, 5 Graphs