Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Hwang, MinJin"'
Publikováno v:
Proc. SPIE 12496, Metrology, Inspection, and Process Control XXXVII, 1249608 (27 April 2023)
In this study, we applied the PointRend (Point-based Rendering) method to semiconductor defect segmentation. PointRend is an iterative segmentation algorithm inspired by image rendering in computer graphics, a new image segmentation method that can g
Externí odkaz:
http://arxiv.org/abs/2302.09569
Autor:
Robinson, John C., Sendelbach, Matthew J., Hwang, MinJin, Dey, Bappaditya, Dehaerne, Enrique, Halder, Sandip, Shin, Young-han
Publikováno v:
Proceedings of SPIE; April 2023, Vol. 12496 Issue: 1 p1249608-1249608-7
