Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Hussien Farhat"'
Autor:
Mohammad Hammoud, Ibrahim Mjallal, Hussien Farhat, Nour Abdallah, Charbel Habchi, Thierry Lemenand
Publikováno v:
Applied Sciences, Vol 11, Iss 19, p 9201 (2021)
The temperature of an electronic device is one of the most important parameters to deal with. Any increase above the temperature limits results in a failure in the device. Thus, to ensure good operation, an electronic device should be cooled. One pro
Externí odkaz:
https://doaj.org/article/e839777f9f7745eca9684eec8584b106
Publikováno v:
Technologies, Vol 6, Iss 1, p 5 (2018)
As the temperature of electronic devices increases, their failure rate increases. That is why electrical devices should be cooled. One of the promising cooling techniques is using Phase Change Materials (PCMs). A new passive temperature management te
Externí odkaz:
https://doaj.org/article/d58c0015a14e469a9ecc11e25785f484
Autor:
Ibrahim Mjallal, Hussien Farhat, Charbel Habchi, Nour Abdallah, Thierry Lemenand, Mohammad Hammoud
Publikováno v:
Applied Sciences
Applied Sciences, MDPI, 2021, 11 (19), pp.9201. ⟨10.3390/app11199201⟩
Applied Sciences, Vol 11, Iss 9201, p 9201 (2021)
Volume 11
Issue 19
Applied Sciences, MDPI, 2021, 11 (19), pp.9201. ⟨10.3390/app11199201⟩
Applied Sciences, Vol 11, Iss 9201, p 9201 (2021)
Volume 11
Issue 19
International audience; The temperature of an electronic device is one of the most important parameters to deal with. Any increase above the temperature limits results in a failure in the device. Thus, to ensure good operation, an electronic device s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a74ac6591e8fef11e78aa5f844b50ae1
https://hal.univ-angers.fr/hal-03457782
https://hal.univ-angers.fr/hal-03457782