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Autor:
Hussian T. Hassim, Hayfa G. Rashid, Khudheir A. Mishjil, Alaa N. Abd Algaffar, Nadir F. Habubi
Publikováno v:
Journal of Physics: Conference Series. 1963:012045
Mixed dielectric films of ZnS and MgF2 have been modeled in IR (3μm) band to reduce a reflectance from ZnS substrate which is around 14%. Reflectance value are enhanced starting from a mixed quarter single layer, double and triple layer as innermost
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::63708101a47696c7995b8e2744d70e85
https://doi.org/10.1088/1742-6596/1963/1/012045
https://doi.org/10.1088/1742-6596/1963/1/012045
