Zobrazeno 1 - 10
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pro vyhledávání: '"Hurd, Trace"'
Autor:
Hurd, Trace Q.
This dissertation focuses on the chemistry, detection, and control of metals and metal contaminants during manufacturing of integrated circuits (ICs) on silicon wafers. Chapter 1 begins with an overview of IC manufacturing, including discussion of th
Externí odkaz:
https://digital.library.unt.edu/ark:/67531/metadc4771/
Autor:
Sakazaki, Tetsuya, Kosugi, Hitoshi, Bassett, Derek W, Simms, Ihsan, Rotondaro, Antonio, Hurd, Trace
Publikováno v:
ECS Transactions; July 2019, Vol. 92 Issue: 2 p127-135, 9p
Akademický článek
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Autor:
Canaperi, Donald F., Papa Rao, Satyavolu S., Hurd, Trace Q., Medd, Steven B., Levin, T. M., Penny, Christopher J., Chen, James H. C., Smalley, Matthew A.
Publikováno v:
MRS Online Proceedings Library; 2010, Vol. 1249 Issue 1, p1-7, 7p
Autor:
Yu, Kyle, Thomas, Nicole, Venkataraman, Shyam S., Pillai, Karthikeyan S., Hurd, Trace, Boggs, Karl, Chyan, Oliver
Publikováno v:
ECS Transactions; April 2011, Vol. 35 Issue: 8 p173-184, 12p
Publikováno v:
Diffusion and Defect Data Part B: Solid State Phenomena; May 2003, Vol. 92 Issue: 1 p1-6, 6p
Autor:
Hall, L., Sees, J., Hurd, Trace, Schmidt, B., Bellay, L., Loewenstein, Lee M., Mertens, Paul W.
Publikováno v:
Diffusion and Defect Data Part B: Solid State Phenomena; November 1998, Vol. 65 Issue: 1 p53-58, 6p
Autor:
Sakazaki, Tetsuya, Kosugi, Hitoshi, Bassett, Derek W, Simms, Ihsan, Rotondaro, Antonio, Hurd, Trace
Publikováno v:
ECS Transactions; July 2019, Vol. 92 Issue: 2
Autor:
Buynak, John D., Borate, H.B., Husting, Chad, Hurd, Trace, Vallabh, Jyoti, Matthew, Jacob, Lambert, Jarvis, Siriwardane, Upali
Publikováno v:
In Tetrahedron Letters 1988 29(40):5053-5056
Autor:
Schmidt, Harald F., Meuris, Marc, Mertens, Paul W., Rotondaro, Antonio L. P., Heyns, Marc M., Hurd, Trace Q., Hatcher, Zach
Publikováno v:
Japanese Journal of Applied Physics; February 1995, Vol. 34 Issue: 2 p727-727, 1p