Zobrazeno 1 - 10
of 27
pro vyhledávání: '"Hung Kung. Liu"'
Autor:
Paul C. DeRose, John C. Travis, Kenneth D. Cole, Hung-Kung Liu, Brian E. Lang, Aaron Urbas, Steven J. Choquette
Publikováno v:
J Res Natl Inst Stand Technol
New spectrophotometers and cuvettes have been designed to allow the measurement of absorbance values from samples using microliter volume sizes. These measurements are done using short pathlengths to decrease the sample volumes required. The major ap
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::efd13f31891d46f91148aa44de7c4588
https://europepmc.org/articles/PMC7339680/
https://europepmc.org/articles/PMC7339680/
Publikováno v:
Journal of Applied Crystallography. 47:1912-1920
The feature sizes of only a few nanometres in modern nanotechnology and next-generation microelectronics continually increase the demand for suitable nanometrology tools. Grazing-incidence small-angle X-ray scattering (GISAXS) is a versatile techniqu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::37bece75e79f56e8b15a81bf6b81de12
https://doi.org/10.1107/s1600576714021050
https://doi.org/10.1107/s1600576714021050
Publikováno v:
Metrologia. 46:345-350
A generalized statistical approach for interlaboratory comparisons with linear trends is proposed. This new approach can be applied to the general case when the artefacts are measured and reported multiple times in each participating laboratory. The
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::21f31fd75696511e6287a3569e4b835f
https://doi.org/10.1088/0026-1394/46/3/024
https://doi.org/10.1088/0026-1394/46/3/024
Publikováno v:
Metrologia. 43:21-26
A statistical analysis for key comparisons with linear trends and multiple artefacts is proposed. This is an extension of a previous paper for a single artefact. The approach has the advantage that it is consistent with the no-trend case. The uncerta
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c9f941655ab3c188742ccebd8d36056e
https://doi.org/10.1088/0026-1394/43/1/003
https://doi.org/10.1088/0026-1394/43/1/003
Publikováno v:
Metrologia. 41:231-237
A statistical analysis for key comparisons with linear trends is proposed. The approach has the advantage that it is consistent with the no-trend cases. The uncertainties for the key comparison reference value, which is time dependent in this case, a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d27445047cdb4c49f6651fc0b1a46ea7
https://doi.org/10.1088/0026-1394/41/4/002
https://doi.org/10.1088/0026-1394/41/4/002
Autor:
G.N. Stenbakken, Hung-kung Liu
Publikováno v:
IEEE Transactions on Instrumentation and Measurement. 53:271-276
Methods were developed to calculate empirical models for device error behavior from data sets with missing data. These models can be used to develop reduced test point testing procedures for the devices. Normally, models are built from only full data
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3678933d1c8202ef7d33811255cbc61d
https://doi.org/10.1109/tim.2003.822481
https://doi.org/10.1109/tim.2003.822481
Autor:
James L. Mudd, Hung-Kung Liu, David L. Duewer, James J. Filliben, Stefan D. Leigh, Lloyd A. Currie, Dennis J. Reeder
Publikováno v:
Analytical Chemistry. 69:1882-1892
The observed total interlaboratory uncertainty in restriction fragment length polymorphism (RFLP) measurements is sufficiently small to be of little significance given current forensic needs. However, as the number of RFLP data increase, further redu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0b76372e0b56f95eb2a089cb795b1ad1
https://doi.org/10.1021/ac961070k
https://doi.org/10.1021/ac961070k
Autor:
Lloyd A. Currie, Hung Kung. Liu, Dennis J. Reeder, David L. Duewer, James L. Mudd, Stefan D. Leigh, F. Samuel. Baechtel
Publikováno v:
Analytical Chemistry. 66:3303-3317
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::00a76baaed31bd644de68163ffe04b33
https://doi.org/10.1021/ac00092a005
https://doi.org/10.1021/ac00092a005
Publikováno v:
Biometrika. 81:103-114
SUMMARY Previously, the connection between bioequivalence tests and their associated confidence intervals was not well understood. In fact, the oc-level two one-sided tests approach was thought to be associated with a 1 -20c confidence interval. In t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bb8339161907028fab9078b141b3bbed
https://doi.org/10.1093/biomet/81.1.103
https://doi.org/10.1093/biomet/81.1.103