Zobrazeno 1 - 10
of 35
pro vyhledávání: '"Hung Chih Hsieh"'
Publikováno v:
Sensors, Vol 23, Iss 9, p 4482 (2023)
The present study introduces an optimized overlay target design to minimize the overlay error caused by asymmetric sidewall structures in semiconductor manufacturing. To achieve this goal, the overlay error formula was derived by separating the asymm
Externí odkaz:
https://doaj.org/article/3954fd53d31f46e39a43c1ed6d5fa4d6
Publikováno v:
Sensors, Vol 23, Iss 9, p 4216 (2023)
An accurate, easy setup, low-cost, and time-saving method for measuring glucose concentration was proposed. An all-grating-based glucose concentration measurement system contained moving-grating-based heterodyne interferometry and a grating-based sel
Externí odkaz:
https://doaj.org/article/837c3af1878a418b9d218c3fa0982a5f
Autor:
Hung Chih Hsieh, 謝宏志
88
The development of wire network makes the data transmission more convenient and swift, but can’t satisfy with the portable and mobile machines. Recently, the major transmitted data is converted from normal data into multimedia, and transmit
The development of wire network makes the data transmission more convenient and swift, but can’t satisfy with the portable and mobile machines. Recently, the major transmitted data is converted from normal data into multimedia, and transmit
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/21844313069873242830
Publikováno v:
Applied optics. 61(6)
A robust and wafer-less wavelength selection methodology was proposed. An overlay calculation model considering the asymmetric bottom grating structure showed that additional intensities diffracted from the asymmetric structure caused the overlay err
Autor:
Hung-Chih Hsieh
Publikováno v:
Optics and Lasers in Engineering. 155:107051
Autor:
Chyan-Chyi Wu, Chen-Yu Ye, Hung-Chih Hsieh, Guan-Yu Ji, Nien-Po Chen, Shang-Yu Hsin, Cheng-Chih Hsu, Ching-Liang Dai, Ke-Cheng Huang
Publikováno v:
Applied Optics. 60:7775
A design method and corresponding fabrication procedures are proposed for a dual frusto-conical reflector of a downlight luminaire. The profile of the dual frusto-conical reflector consists of two flat-slant reflective surfaces with slightly differen
Publikováno v:
Optics Communications. 285:5337-5340
Based on the projection moire method and heterodyne interferometry, this study proposes an alternative method for reconstructing the surface profile of an object. Obliquely illuminating a linear grating with an expanding collimated light, a self-imag
Publikováno v:
Displays. 31:191-195
The two-dimensional refractive index distribution of a flexible indium tin oxide film deposited on a PET layer is measured before/after the bend-testing with an alternative technique based on Fresnel equations and the heterodyne interferometry. Their
Publikováno v:
physica status solidi c. 5:1016-1019
Based on Fresnel equations and the phase-shifting interferometry, an alternative method for measuring the two-dimensional refractive index distribution of a material is presented. A linearly polarized light passes through a quarter wave-plate and is
Publikováno v:
Optics Communications. 268:23-26
Based on the total internal reflection of p-polarized light and the phase-shifting interferometry, an alternative method for measuring the two-dimensional refractive index distribution of a material is presented. The p-polarized light is incident on