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pro vyhledávání: '"Huiyuan Song"'
Autor:
Ya-ch Lai, Mealie Zhang, Philippe Hurat, Michel Luc Cote, Yifan Zhang, Huiyuan Song, Helen Li, Waisum Wong, Wei Xu, Hua Ding, Jason Huang
Publikováno v:
SPIE Proceedings.
Advanced process nodes introduce new variability effects due to increased density, new material, new device structures, and so forth. This creates more and stronger Layout Dependent effects (LDE), especially below 28nm. These effects such as WPE (Wel
Autor:
Wei Xu, Woo Hyun Paik, Yongchan Ban, Philippe Hurat, Ya-Chieh Lai, Huiyuan Song, Yongseok Kang, Jason Sweis
Publikováno v:
SPIE Proceedings.
With increasing chip sizes and shrinking device dimensions, on-chip semiconductor process variation can no longer be ignored in the design and signoff static timing analysis of integrated circuits. An important parameter affecting CMOS technologies i