Zobrazeno 1 - 10
of 19
pro vyhledávání: '"Huihui Wen"'
Publikováno v:
Sensors, Vol 23, Iss 6, p 3317 (2023)
To solve the problems of the traditional 3D-DIC algorithm based on feature information or FFT search at the expense of accuracy in exchange for time, such as error-point extraction, mismatching of feature points, poor robustness, and accuracy loss ca
Externí odkaz:
https://doaj.org/article/056078f500d94e3e95a79b965e576614
Publikováno v:
Materials, Vol 15, Iss 19, p 6915 (2022)
The single-crystal Ni-based superalloys, which have excellent mechanical properties at high temperatures, are commonly used for turbine blades in a variety of aero engines and industrial gas turbines. Focusing on the phase interface of a second-gener
Externí odkaz:
https://doaj.org/article/0d2750142bbd4cd5b711f1f495a9dbbc
Autor:
Faqi Diao, Huihui Weng, Jean-Paul Ampuero, Zhigang Shao, Rongjiang Wang, Feng Long, Xiong Xiong
Publikováno v:
Nature Communications, Vol 15, Iss 1, Pp 1-9 (2024)
Abstract The seismic hazard of a fault system is controlled by the maximum possible earthquake magnitude it can host. However, existing methods to estimate maximum magnitudes can result in large uncertainties or ignore their temporal evolution. Here,
Externí odkaz:
https://doaj.org/article/716389788d62467080d7fbf2339305ab
Publikováno v:
Applied optics. 61(2)
Interface plays an important role in determining several properties in multiphase systems. It is also essential for the accurate measurement of the interface structure in a single crystal Ni-based superalloy (SCNBS) under different conditions. In thi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fa93e59b1d0ba2b9ad9094f5e32230f8
https://pubmed.ncbi.nlm.nih.gov/35200898
https://pubmed.ncbi.nlm.nih.gov/35200898
Publikováno v:
Nanotechnology. 33:385706
Geometric phase analysis (GPA) is a powerful tool to investigate the deformation in nanoscale measurement, especially in dealing with high-resolution transmission electron microscopy images. The traditional GPA method using the fast Fourier transform
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::71949b21ba3cd1a30da8ed193a5e30b2
https://doi.org/10.1088/1361-6528/ac780f
https://doi.org/10.1088/1361-6528/ac780f
Publikováno v:
Nanotechnology. 32:475705
Strain is one of the important factors that determine the photoelectric and mechanical properties of semiconductor materials and devices.In this paper, the scanning transmission electron microscopy (STEM) multiplication nano-moire method is proposed
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ae19add26af105bc54c2560bf3f5b505
https://doi.org/10.1088/1361-6528/ac1543
https://doi.org/10.1088/1361-6528/ac1543
Publikováno v:
Nanoscale. 9:15923-15933
Moiré technique is a powerful, important and effective tool for scientific research, from the nano-scale to the macro-scale, which is essentially the interference between two or more periodic structures with a similar frequency. In this study, an in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4ce2f4e44855739126218a1689d4e1db
https://doi.org/10.1039/c7nr04262k
https://doi.org/10.1039/c7nr04262k
Publikováno v:
Ultramicroscopy. 171:34-42
Geometrical phase analysis (GPA) is typically a powerful tool to investigate the deformation in high resolution transmission electron microscopy images and has been used in various fields. The traditional GPA method using the fast Fourier transform,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6fc481943471f40123498cc1af51a8a1
https://doi.org/10.1016/j.ultramic.2016.08.019
https://doi.org/10.1016/j.ultramic.2016.08.019
Publikováno v:
Applied Surface Science. 515:145934
When an AlAsSb/InAs superlattice semiconductor material is grown by molecular beam epitaxy, extended defects in the GaSb buffer layer are inevitable. Therefore, the study the formation and evolution of extended defects is considerably important. In t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0c9b17ea9a71e12dc66fb4c5c8c9141d
https://doi.org/10.1016/j.apsusc.2020.145934
https://doi.org/10.1016/j.apsusc.2020.145934
Publikováno v:
Optics Express. 27:36990
In high-resolution transmission electron microscopy (HRTEM) images of heterostructures, it is always difficult to accurately determine the interface position and identify dislocations in a large field of view at tens to hundreds of nanometers due to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::09e7abfb1168b5fac03370e6a008d751
https://doi.org/10.1364/oe.27.036990
https://doi.org/10.1364/oe.27.036990