Zobrazeno 1 - 10
of 27
pro vyhledávání: '"Huibing Hao"'
Autor:
Huibing Hao, Chunping Li
Publikováno v:
Shock and Vibration, Vol 2022 (2022)
A multi-state reliability analysis model suffering from a dependent competing failure process is developed in this study, where the soft failure is described by general nonlinearity random effect. Wiener degradation process with measurement error and
Externí odkaz:
https://doaj.org/article/eaa2047b1bc042a2b7ffe985ee767300
Publikováno v:
Shock and Vibration, Vol 2020 (2020)
This paper focuses on system reliability analysis with dependent competing failure process due to soft failure and hard failure. Some new probabilistic methods based on cumulative shock model and nonlinear Wiener process under different shifting thre
Externí odkaz:
https://doaj.org/article/321a580d93b84dbc99bf174b28461949
Publikováno v:
International Journal of Photoenergy, Vol 2015 (2015)
Light emitting diode (LED) lamp has attracted increasing interest in the field of lighting systems due to its low energy and long lifetime. For different functions (i.e., illumination and color), it may have two or more performance characteristics. W
Externí odkaz:
https://doaj.org/article/14a53ad11bf44d11ad228cbd443e8d03
Autor:
Huibing Hao1 haohuibing@163.com, Chunping Li2 lichunping315@163.com
Publikováno v:
IAENG International Journal of Applied Mathematics. Jun2024, Vol. 54 Issue 6, p1083-1088. 6p.
Publikováno v:
Iranian Journal of Science. 47:457-466
Publikováno v:
Communications in Statistics - Simulation and Computation. :1-14
Publikováno v:
Shock and Vibration, Vol 2020 (2020)
This paper focuses on system reliability analysis with dependent competing failure process due to soft failure and hard failure. Some new probabilistic methods based on cumulative shock model and nonlinear Wiener process under different shifting thre
Autor:
Huibing Hao, Chunping Li
Publikováno v:
Mathematical Problems in Engineering.
The objective of this study is to construct some system-level reliability models subject to new dependent competing failure process of the soft failure process and hard failure process. In those complex system-level models, the soft failure caused by
Autor:
Chunping Li1 lichunping315@163.com, Huibing Hao1,2 haohuibing1979@163.com
Publikováno v:
IAENG International Journal of Applied Mathematics. Sep2019, Vol. 49 Issue 3, p369-374. 6p.
Autor:
Huibing Hao1,2 haohuibing1979@163.com, Chunping Li1 lichunping315@163.com
Publikováno v:
Engineering Letters. 2019, Vol. 27 Issue 2, p133-137. 5p.