Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Hui-Ting Yen"'
Autor:
Hui-Ting Yen, 顏慧婷
93
Electroless plating technique was utilized to prepare the cobalt-phosphorous (Co-P) thin film to serve as the diffusion barrier layer of lead-tin (Pb-Sn) solder. Co-P/solder interfacial reactions were characterized in order to evaluate the fe
Electroless plating technique was utilized to prepare the cobalt-phosphorous (Co-P) thin film to serve as the diffusion barrier layer of lead-tin (Pb-Sn) solder. Co-P/solder interfacial reactions were characterized in order to evaluate the fe
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/82159016632260457186
Autor:
Jiong-Bo Chen, Garuda Raka Satria Dewangga, Chung-Feng Jeffrey Kuo, Hui-Ting Yen, Wei-Lun Lan, Shu-Hao Chang
Publikováno v:
Textile Research Journal. 89:3987-3996
This study introduced multi-quality optimization using the Taguchi method combined with response surface methodology (RSM) and the particle swarm optimization (PSO) method for synthesizing pressure sensitive adhesives (PSAs) of ultraviolet curing opt
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::620ff4f095792bf8d798b75fc6960e1a
https://doi.org/10.1177/0040517519826934
https://doi.org/10.1177/0040517519826934
Publikováno v:
Textile Research Journal. 89:926-935
This study synthesized a series of prepolymers from butyl acrylate and functional monomer with various side-chain structures. A bulk polymerization process was then applied under ultraviolet irradiation. The molecular structure of the prepolymer was
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::324486a87129acc9ad323b152641b3ae
https://doi.org/10.1177/0040517518763993
https://doi.org/10.1177/0040517518763993
Publikováno v:
Journal of Electronic Materials. 35:1593-1599
The capability of a cobalt-phosphorous [Co(P)] layer, which was grown via the electroless plating process, to serve as the diffusion barrier of lead-tin (PbSn) solder was investigated in this work. The Auger electron spectroscopy (AES) and energy dis
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::90955e60cb54b398e9bf392ae92cc8a9
https://doi.org/10.1007/s11664-006-0153-6
https://doi.org/10.1007/s11664-006-0153-6
Publikováno v:
Journal of Electronic Materials; Jul2006, Vol. 35 Issue 7, p1593-1593, 1p