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Autor:
Hugo Cintas, Frédéric Wrobel, Marine Ruffenach, Damien Herrera, Frédéric Saigné, Athina Varotsou, Françoise Bezerra, Julien Mekki
Publikováno v:
Aerospace, Vol 10, Iss 3, p 295 (2023)
The device downscaling of electronic components has given rise to the need to consider specific failures in onboard airplane electronics. Single Event Effects (SEE) are a kind of failures that occur due to radiation in the atmosphere. For the purpose
Externí odkaz:
https://doaj.org/article/02f0179eb21f466cbd918c47b24d00bd