Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Hsueh-Yu Kao"'
Autor:
Cheng-Ying Li, Ze-Hui Chen, Hsueh-Yu Kao, Sheng-Kai Chang, Po-Yu Hsiao, Yen-Hsiang Huang, Yu-Chieh Huang, Sheng-Yuan Chu, Chia-Ling Wei, Yun-Hui Liu, Kuang-Wei Cheng, Cheng-Che Tsai
Publikováno v:
IEEE Transactions on Instrumentation and Measurement. 72:1-11
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5c31222b80f37acbb93e5c87ac3cc548
https://doi.org/10.1109/tim.2023.3242016
https://doi.org/10.1109/tim.2023.3242016
Autor:
Cheng-Che Tsai, Chia-Ling Wei, Sheng-Yuan Chu, Yi-Hsun Wang, Yen-Hsiang Huang, Hsueh-Yu Kao, Cheng-Ying Li, Ze-Hui Chen, Yun-Hui Liu, Po-Yu Hsiao
Publikováno v:
IEEE Transactions on Electron Devices. 67:4399-4404
In this study, we successfully deposited ${c}$ -axis-oriented aluminum nitride piezoelectric films via low-temperature dc sputtering method. Based on the X-ray diffraction (XRD) and TEM analyses, deposited films with a ${c}$ -axis monocrystal were id
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::72dc30c4a42f2d571d4168f72c8c4408
https://doi.org/10.1109/ted.2020.3019230
https://doi.org/10.1109/ted.2020.3019230
Autor:
Chia-Ling Wei, Cheng Shong Hong, Sheng-Yuan Chu, Yu Chun Chien, Hsueh Yu Kao, Cheng Che Tsai, Yun-Hui Liu
Publikováno v:
Journal of the American Ceramic Society. 102:4056-4066
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::98b7d49999989de2dab5deeaab9f450a
https://doi.org/10.1111/jace.16255
https://doi.org/10.1111/jace.16255
Autor:
Tsai, Cheng‐Che1 (AUTHOR) jertsai@seed.net.tw, Chien, Yu‐Chun2 (AUTHOR), Hong, Cheng‐Shong3 (AUTHOR) cshong@nknu.edu.tw, Chu, Sheng‐Yuan2,4 (AUTHOR) chusy@mail.ncku.edu.tw, Wei, Chia‐Ling2 (AUTHOR), Liu, Yun‐Hui5 (AUTHOR), Kao, Hsueh‐Yu2 (AUTHOR)
Publikováno v:
Journal of the American Ceramic Society. Jul2019, Vol. 102 Issue 7, p4056-4066. 11p. 11 Diagrams, 5 Charts, 5 Graphs.
Autor:
Chen, Ze-Hui, Li, Cheng-Ying, Chu, Sheng-Yuan, Tsai, Cheng-Che, Wang, Yi-Hsun, Kao, Hsueh-Yu, Wei, Chia-Ling, Huang, Yen-Hsiang, Hsiao, Po-Yu, Liu, Yun-Hui
Publikováno v:
IEEE Transactions on Electron Devices; Oct2020, Vol. 67 Issue 10, p4399-4404, 6p