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pro vyhledávání: '"Hsueh-Chun Kang"'
Publikováno v:
IEEE Transactions on Electron Devices. 63:4218-4225
In this paper, the AlGaN/GaN high electron mobility transistors on a low resistivity Si substrate with the hybrid drain structure for RF applications are analyzed in detail, based on measurements, TCAD simulation, model extraction, and delay time cal