Zobrazeno 1 - 10
of 25
pro vyhledávání: '"Hsu-Ting Huang"'
Autor:
Hsu-ting Huang, 黃勗庭
99
This study illustrates four pieces of artworks that comprising the themes of “Residual Taste of Life, “Swimming,” “Displacement,” “Remaining,” and “Adjust; Change.” The creating process is a journey, taken from 2008 to 2010,
This study illustrates four pieces of artworks that comprising the themes of “Residual Taste of Life, “Swimming,” “Displacement,” “Remaining,” and “Adjust; Change.” The creating process is a journey, taken from 2008 to 2010,
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/82481811584009763971
Autor:
Hsu-ting Huang, 黃旭廷
90
The aim of this study is in order to investigate strategies to promote knowledge management in senior high school. The results of the study were expected to help the personnel of the senior high school promoting knowledge management in educat
The aim of this study is in order to investigate strategies to promote knowledge management in senior high school. The results of the study were expected to help the personnel of the senior high school promoting knowledge management in educat
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/80465195969863961296
Akademický článek
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Publikováno v:
Total Quality Management & Business Excellence. 31:353-372
This research develops a team-level model based on transactive memory theory to analyze how teams achieve excellent performance by managing innovative climate and politics. In the model, team perfo...
Publikováno v:
Tetrahedron. 61:4461-4466
The ρ values of free radical SH2′ reactions have been determined in various solvents. The correlation of Hammett ρ with Taft's π* gives a W value of 0.70. The W value is a measure of susceptibility of the reaction constant to change in solvent p
Autor:
Fred L. Terry, Hsu Ting Huang
Publikováno v:
Thin Solid Films. 468:339-346
Spectroscopic, specular reflected light measurements (both ellipsometry-SE, and reflectometry-SR) of grating structures have relatively recently been shown to yield very accurate information on the critical dimensions, wall-angles and detailed wall s
Autor:
Hsu Ting Huang, Fred L. Terry
Publikováno v:
Thin Solid Films. :828-836
Spectroscopic, specular reflected light measurements (both ellipsometry-SE, and reflectometry-SR) of grating structures have relatively and recently been shown to yield very accurate information on the critical dimensions, wall-angles and detailed wa
Publikováno v:
Extreme Ultraviolet (EUV) Lithography IV.
Extreme ultra-violet (EUV) lithography has been planned for high-volume manufacturing (HVM) in 2014 for critical layers of advanced nodes in the semiconductor industry. Process and proximity correction (PPC) and verification is necessary in order to
Publikováno v:
SPIE Proceedings.
Extreme ultra-violet (EUV) lithography is a promising solution for semiconductor manufacturing for the 1Xnm node and beyond. Due to the mask shadowing effect and strong flare, process and proximity correction (PPC) is required for EUV lithography eve
Autor:
Ching-Mei Hsu, Grozdan Grozev, Hsu-Ting Huang, Tamer H. Coskun, Chris Ngai, Huixiong Dai, Mario Reybrouck, Gaetano Santoro, Vishnu Kamat
Publikováno v:
SPIE Proceedings.
In this paper we demonstrate the feasibility of Negative Tone Development (NTD) process to pattern 22nm node contact holes leveraging freeform source and model based assist features. We demonstrate this combined technology with detailed simulation an