Výsledky vyhledávání - "Hsing-Yi Liang"

Akademický článek

Electroencephalogram-Driven Machine-Learning Scenario for Assessing Impulse Control Disorder Comorbidity in Parkinson’s Disease Using a Low-Cost, Custom LEGO-Like Headset

Autor: Wei-Che Lin, Wei-Jen Chen, Yueh-Sheng Chen, Hsing-Yi Liang, Cheng-Hsien Lu, Yuan-Pin Lin

Publikováno v: IEEE Transactions on Neural Systems and Rehabilitation Engineering, Vol 31, Pp 4106-4114 (2023)

Patients with Parkinson’s disease (PD) may develop cognitive symptoms of impulse control disorders (ICDs) when chronically treated with dopamine agonist (DA) therapy for motor deficits. Motor and cognitive comorbidities critically increase the disa

Externí odkaz: https://doaj.org/article/14ae2de1806b46f096db3bfd1221f527

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Akademický článek

Objective assessment of impulse control disorder in patients with Parkinson’s disease using a low-cost LEGO-like EEG headset: a feasibility study

Autor: Yuan-Pin Lin, Hsing-Yi Liang, Yueh-Sheng Chen, Cheng-Hsien Lu, Yih-Ru Wu, Yung-Yee Chang, Wei-Che Lin

Publikováno v: Journal of NeuroEngineering and Rehabilitation, Vol 18, Iss 1, Pp 1-12 (2021)

Abstract Background Patients with Parkinson’s disease (PD) can develop impulse control disorders (ICDs) while undergoing a pharmacological treatment for motor control dysfunctions with a dopamine agonist (DA). Conventional clinical interviews or qu

Externí odkaz: https://doaj.org/article/3a24dac9252a492f9fbad296250607a6

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Objective assessment of impulse control disorder in patients with Parkinson’s disease using a low-cost LEGO-like EEG headset: a feasibility study

Autor: Hsing-Yi Liang, Wei-Che Lin, Yuan-Pin Lin, Cheng-Hsien Lu, Yueh-Sheng Chen, Yung-Yee Chang, Yih-Ru Wu

Publikováno v: Journal of NeuroEngineering and Rehabilitation, Vol 18, Iss 1, Pp 1-12 (2021)
Journal of NeuroEngineering and Rehabilitation

Background Patients with Parkinson’s disease (PD) can develop impulse control disorders (ICDs) while undergoing a pharmacological treatment for motor control dysfunctions with a dopamine agonist (DA). Conventional clinical interviews or questionnai

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3151a5f12c94cb3fd4dc8482700b80bd
https://doi.org/10.1186/s12984-021-00897-1

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Objective Assessment of Impulse Control Disorder in Patients with Parkinson’s Disease Using a Low-Cost LEGO-Like EEG Headset

Autor: Yueh-Sheng Chen, Yung-Yee Chang, Yih-Ru Wu, Yuan-Pin Lin, Wei-Che Lin, Hsing-Yi Liang, Cheng-Hsien Lu

BackgroundPatients with Parkinson’s disease (PD) can develop the cognitive adverse effect of impulse control disorders (ICDs) while undergoing a pharmacological treatment for motor control dysfunctions with a dopamine agonist (DA). Conventional cli

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::15f292459e939a6260a59646b49b46f4
https://doi.org/10.21203/rs.3.rs-125029/v1

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Degradation Dependent on Channel Width in Sequential Lateral Solidified Poly-Si Thin Film Transistors

Autor: Chrong Jung Lin, Hsing-Yi Liang, Hung-Tse Chen, Szu-I Hsieh, Ya-Chin King

Publikováno v: 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.

Sequential lateral solidification (SLS) technology developed for crystallizing amorphous Si enlarges grain size effectively. However, thin-film transistors made by SLS suffer reliability issues possibly due to the innate sub-grain boundaries parallel

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::8677ad13101c5e78a5ac1b8159218c03
https://doi.org/10.1109/relphy.2007.369568

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Dissertation/ Thesis

Study of Channel-width-dependent Reliability Behavior of LTPS TFTs

Autor: Hsing-Yi Liang, 梁馨宜

95
Sequential lateral solidification (SLS) technology developed for crystallizing amorphous Si enlarges grain size and controls the position of grain boundaries effectively. However, thin-film transistors made by SLS suffer reliability issues po

Externí odkaz: http://ndltd.ncl.edu.tw/handle/55435106310280633596

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Stress-induced width-dependent degradation of low-temperature polycrystalline silicon thin-film transistor

Autor: Chrong Jung Lin, Hsing-Yi Liang, Szu-I Hsieh, Ya-Chin King, Hung-Tse Chen

Publikováno v: Applied Physics Letters. 90:183502

This study characterizes the stress-induced subthreshold degradation effect in low-temperature polycrystalline silicon thin-film transistors (LTPS-TFTs) formed using sequential lateral solidified (SLS) crystallization on a glass substrate. The SLS pr

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::10371f0747507f71cf8964be147c8c85
https://doi.org/10.1063/1.2734504

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