Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Hsiao Tso Su"'
Autor:
Meu Rurng Tseng, Heh Lung Huang, Hsin-Fei Meng, Yu Chiang Chao, Yu Fan Chang, Chao Hsuan Chen, Lan Sheng Yang, Teng-Chih Chao, Chih-Wei Luo, K.P.O. Mahesh, Si Yi Liao, Hsiao-Wen Zan, Mu Chun Niu, Hsiao Tso Su, Sheng-fu Horng
Publikováno v:
ChemPlusChem. 84:1375-1383
The instability of the organic light-emitting diodes (OLEDs) during operation can be attributed to the existence of point defects on the organic layers. In this work, the effect of mixed-host emissive layer and the thermal annealing treatment were in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f7b8e42eca78e7a29fb8af68a417fb66
https://doi.org/10.1002/cplu.201900248
https://doi.org/10.1002/cplu.201900248
Autor:
Yu Chiang Chao, Yu Fan Chang, Si Yi Liao, Sheng-fu Horng, Chun Yen, Chang Chih-Yu, Yung Hung Hsiao, Hsiao Tso Su, Hsin-Fei Meng, Mu Chun Niu, Hsiao-Wen Zan, Chang Chiung-Wen
Publikováno v:
RSC Advances. 9:10584-10598
The electrical current leakage and stability are studied for solution-processed OLEDs with areas of 4.45 mm2, 3 × 3.2 cm2, and 6 × 11.5 cm2. The emission layer of the OLED has a ternary or binary mixed host with hole-transporting molecules tris(4-c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::03a7122acb7abc57768cbaa42b8ccb99
https://doi.org/10.1039/c8ra10363a
https://doi.org/10.1039/c8ra10363a
Autor:
Si-Yi, Liao, Hsiao-Tso, Su, Yung-Hung, Hsiao, Yu-Fan, Chang, Chiung-Wen, Chang, Mu-Chun, Niu, Hsin-Fei, Meng, Chun, Yen, Yu-Chiang, Chao, Chih-Yu, Chang, Hsiao-Wen, Zan, Sheng-Fu, Horng
Publikováno v:
RSC advances. 9(19)
The electrical current leakage and stability are studied for solution-processed OLEDs with areas of 4.45 mm
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::69b05afc8f27c248246a5f3f53c0b16f
https://pubmed.ncbi.nlm.nih.gov/35515314
https://pubmed.ncbi.nlm.nih.gov/35515314