Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Hristiyan Y. Stoyanov"'
Autor:
I. L. Stefanov, Georgi B. Hadjichristov, Stoyan C. Russev, Gichka G. Tsutsumanova, Hristiyan Y. Stoyanov
Publikováno v:
Vacuum. 86:1822-1827
The material in the ion-modified surface layer formed in polymethylmethacrylate (PMMA) is optically characterized by calculations based on multilayer model and optical reflectance data. PMMA was subjected to a low energy (50 keV) silicon ion implanta
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cf6b714a3c78f66cd534816d4b71eb4c
https://doi.org/10.1016/j.vacuum.2012.04.030
https://doi.org/10.1016/j.vacuum.2012.04.030
Autor:
Hristiyan Y. Stoyanov
Publikováno v:
Optics & Laser Technology. 39:885-891
In this paper we describe a new simple interferometric method for measurement of the thickness of a very thin quivette filled with absorbing liquid. The method is based on the interferometric restoration and analysis of both p- and s-components of th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d7d44e63c48e53ed7bf499e521f3502b
https://doi.org/10.1016/j.optlastec.2006.07.006
https://doi.org/10.1016/j.optlastec.2006.07.006
Autor:
Hristiyan Y. Stoyanov
Publikováno v:
Optics & Laser Technology. 35:409-414
The proximity sensing based on the attenuated total internal reflection (ATIR) is a technique that allows us to control the separation between two planes—the attenuating media surface and dielectric boundary, in the neighborhood of which the total
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7a16f8531b9456ccb3f54deca7d4093f
https://doi.org/10.1016/s0030-3992(03)00035-5
https://doi.org/10.1016/s0030-3992(03)00035-5
Autor:
Hristiyan Y. Stoyanov
Publikováno v:
Optics & Laser Technology. 32:147-152
A simple interferometric phasemeter which can be used as a proximity sensor is described. It is based on the measurement of the phase shift between the p- and s- components of a field caused by the processes of attenuation in total internal reflectio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f925ea4fe842c1922d4ba60788e7c863
https://doi.org/10.1016/s0030-3992(00)00036-0
https://doi.org/10.1016/s0030-3992(00)00036-0
Autor:
Georgi B. Hadjichristov, Stoyan C. Russev, Gichka G. Tsutsumanova, I. L. Stefanov, Hristiyan Y. Stoyanov, Elitza Petrova
Publikováno v:
SPIE Proceedings.
The depth profile of the complex refractive index of silicon ion (Si + ) implanted polymethylmethacrylate (PMMA) is studied, in particular PMMA implanted with Si + ions accelerated to a relatively low energy of 50 keV and at a fluence of 3.2 × 10 15
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a4b1e71e80f3940352ade426b0e51fb3
https://doi.org/10.1117/12.2011989
https://doi.org/10.1117/12.2011989
Autor:
Hristiyan Y. Stoyanov
Publikováno v:
SPIE Proceedings.
In this paper we describe a simple interferometric phasemeter which can be used as a linear sensor. This method is based on the interferometric restoration of both p - and s -components of the resultant field. The phase shift between them as a functi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f40b901ebd6fe8a55c65476313780518
https://doi.org/10.1117/12.726902
https://doi.org/10.1117/12.726902