Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Howoo Park"'
Autor:
Hyuncheol Kim, Yun Hyeok Kim, Sanghyuck Moon, Hwanwoong Kim, Byeongjun Yoo, Jueun Park, Seyoung Kim, June-Mo Koo, Sewon Seo, Hye Ji Shin, Younghwan Choi, Jinwoo Kim, Kyungil Kim, Jae-Hoon Seo, Seunghyun Lim, Taesub Jung, Howoo Park, Sangil Jung, Juhyun Ko, Kyungho Lee, JungChak Ahn, JoonSeo Yim
Publikováno v:
2023 IEEE International Solid- State Circuits Conference (ISSCC).
Autor:
Hye Yeon Park, Yunki Lee, Jonghoon Park, Hyunseok Song, Taesung Lee, Hyung Keun Gweon, Yunji Jung, Jeongmin Bae, Boseong Kim, Junwon Han, Seungwon Kim, Cheolsang Yoon, Jeongki Kim, Changkeun Lee, Sehoon Yoo, EuiYeol Kim, Hyunmin Baek, Howoo Park, Bumsuk Kim, JungChak Ahn, JoonSeo Yim
Publikováno v:
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits).
Autor:
Jungbin Yun, Seungjoon Lee, Seungwon Cha, Jihun Kim, Jeongho Lee, Hanseok Kim, Eungkyu Lee, Seonok Kim, Seunghan Hong, Hyungchae Kim, Jinsuk Huh, Sungchul Kim, Kazunori Kakehi, Jae-Ho Kim, June-Mo Koo, Eunsang Cho, Heegeun Jeong, Howoo Park, Kyungho Lee, JungChak Ahn, JoonSeo Yim
Publikováno v:
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits).
Autor:
Jong-Won Choi, Hyun-cheol Kim, Kyungduck Lee, Eun Sub Shim, Junghyung Pyo, Taesub Jung, Jung-Chak Ahn, Seungki Baek, Bum-Suk Kim, Sungsoo Choi, Chanhee Lee, Kyoung-mok Son, Howoo Park, Jun-seok Yang, Duckhyun Chang, Se-Young Kim, Woo-Seok Choi, Jungbin Yun, Kyung-Ho Lee
Publikováno v:
VLSI Circuits
We developed a dual pixel with accurate and all-directional auto focus (AF) performance in CMOS image sensor (CIS). The optimized in-pixel deep trench isolation (DTI) provided accurate AF data and good image quality in the entire image area and over
Autor:
Chongkwang Chang, In-sung Joe, Chang-Rok Moon, Jong-Eun Park, Jamie Lee, Kwan-Sik Cho, Soo-jin Hong, Hyun-Chul Kim, Im Dongmo, Chung-sam Jun, WooGwan Shim, Beom-Suk Lee, Ho-Kyu Kang, Sungbong Park, Jung-Chak Ahn, Donghyuk Park, Young-ki Hong, Howoo Park, Euiyeol Kim, Tae-Hoon Kim, Jingyun Kim, Dong-Hyun Kim, Taehee Kim, Ho-Chul Ji, Jae-Kyu Lee, Yi-tae Kim, Sung-In Kim, Taehun Lee, Jungho Cha, Changkyu Lee, Haeyong Park, Jin-Young Kim
Publikováno v:
ISSCC
For years, there has been a strong drive for sub-micron pixel development, in spite of reaching the visible light diffraction limit, because a smaller pixel pitch of CMOS image sensors (CISs) is inevitably required for ever-miniaturizing camera modul
Autor:
Jeongjin Cho, Minji Jung, Taesub Jung, Masato Fujita, Kyungho Lee, Youjin Jung, Sungmin Ahn, Howoo Park, Dukseo Park, Younguk Song, Takashi Nagano, Jung Chak Ahn, Yongin Park
Publikováno v:
Extended Abstracts of the 2020 International Conference on Solid State Devices and Materials.
Autor:
Taesub Jung, Jungbin Yun, Hyunpil Noh, Doosik Seol, Seungki Jung, Dukseo Park, Jihun Kim, Kyung-Ho Lee, Long Yan, Junghyung Pyo, Takashi Nagano, Jungwook Lim, Jung-Chak Ahn, Howoo Park
Publikováno v:
Electronic Imaging. 33:66-1