Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Howells, Sam"'
Autor:
Lamb, Lowell D., Huffman, Donald R., Workman, Richard K., Howells, Sam, Chen, Ting, Sarid, Dror, Ziolo, Ronald F.
Publikováno v:
Science, 1992 Mar . 255(5050), 1413-1416.
Externí odkaz:
https://www.jstor.org/stable/2876398
Autor:
Allen, Paul C., Bohan, Mike, Christenson, Eric R., Dai, H., Duane, M., Hamaker, H. C., Howells, Sam C., Kenan, Boaz, Pirogovsky, Peter, Sadiq, Malik K., Teitzel, Robin, White, Michael
Publikováno v:
Proceedings of SPIE; Nov2005, Issue 1, p37-50, 14p
Autor:
Allen, Paul C., Bohan, Michael J., Christenson, Eric R., Hamaker, H. Christopher, Howells, Sam C., Kenan, Boaz, Pirogovsky, Peter, Sadiq, Malik K., Teitzel, Robin L., White, Michael C., Ungureit, Michael, Wickstrom, Alan, Kiefer, Robert, Jackson, Curt
Publikováno v:
Proceedings of SPIE; Nov2004, Issue 1, p279-290, 12p
Autor:
Sarid, Dror, Pax, Paul, Yi, Leon, Howells, Sam, Gallagher, Mark, Chen, Ting, Elings, Virgil, Bocek, Dan
Publikováno v:
Review of Scientific Instruments; Aug1992, Vol. 63 Issue 8, p3905, 4p
Autor:
Howells, Samuel Charles.
Using scanning probe microscopy, several studies were carried out to characterize surface topographies and properties. First, utilizing scanning tunneling microscopy (STM), we characterized fullerenes deposited onto gold foils and highly oriented gol
Externí odkaz:
http://hdl.handle.net/10150/185905
Publikováno v:
In Surface Science 1992 278(3):270-280