Zobrazeno 1 - 10
of 70
pro vyhledávání: '"Howells, Malcolm R."'
Autor:
McNulty, Ian, Kirz, Janos, Jacobsen, Chris, Anderson, Erik H., Howells, Malcolm R., Kern, Dieter P.
Publikováno v:
Science, 1992 May . 256(5059), 1009-1012.
Externí odkaz:
https://www.jstor.org/stable/2877125
Publikováno v:
Scientific American, 1991 Feb 01. 264(2), 88-95.
Externí odkaz:
https://www.jstor.org/stable/24936794
Autor:
Jacobsen, Chris, Howells, Malcolm R.
Publikováno v:
Journal of Applied Physics; 3/15/1992, Vol. 71 Issue 6, p2993, 9p, 11 Black and White Photographs, 3 Diagrams, 9 Graphs
Autor:
Warwick, Tony, Howells, Malcolm R., Jacobsen, Chris J., Kevan, Stephen D., Kirz, Janos, Spence, John C.H.
Publikováno v:
Warwick, Tony; Howells, Malcolm R.; Jacobsen, Chris J.; Kevan, Stephen D.; Kirz, Janos; & Spence, John C.H.(2008). Beamlines for Coherent Xray Diffractive Imaging and Scattering at the Advanced Light Source. Lawrence Berkeley National Laboratory: Lawrence Berkeley National Laboratory. Retrieved from: http://www.escholarship.org/uc/item/2fb1v7ps
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______325::32661d66bddfc058544a857ecde3dcc5
http://www.escholarship.org/uc/item/2fb1v7ps
http://www.escholarship.org/uc/item/2fb1v7ps
Autor:
Yashchuk, Valeriy V., Church, Eugene L., Howells, Malcolm R., McKinney, Wayne R., Takacs, Peter Z.
Publikováno v:
Yashchuk, Valeriy V.; Church, Eugene L.; Howells, Malcolm R.; McKinney, Wayne R.; & Takacs, Peter Z.(2005). 21st Century Metrology for Synchrotron Radiation Optics-Understanding How to Specify and Characterize Optics. Lawrence Berkeley National Laboratory: Lawrence Berkeley National Laboratory. Retrieved from: http://www.escholarship.org/uc/item/0b22h76t
As early as 1989 [1,2], E. Church and P. Takacs presented a systematic theoretical foundation for characterization of X-ray optics in terms of imaging system performance, accounting for surface figure and finish errors. Physically, the distinction be
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______325::b7d9771078453344f88f37f7b9a96de2
http://www.escholarship.org/uc/item/0b22h76t
http://www.escholarship.org/uc/item/0b22h76t
Autor:
Yashchuk, Valeriy V., Gullikson, Eric M., Howells, Malcolm R., Irick, Steve C., MacDowell, Alastair A., McKinney, Wayne R., Salmassi, Farhad, Warwick, Tony, Metz, James P., Tonnessen, Thomas W.
Publikováno v:
Yashchuk, Valeriy V.; Gullikson, Eric M.; Howells, Malcolm R.; Irick, Steve C.; MacDowell, Alastair A.; McKinney, Wayne R.; et al.(2005). Surface Roughness of Stainless Steel Bender Mirrors for Focusing Soft X-rays. Lawrence Berkeley National Laboratory. Lawrence Berkeley National Laboratory: Lawrence Berkeley National Laboratory. Retrieved from: http://www.escholarship.org/uc/item/0hr2v5bt
We have used polished stainless steel as a mirror substrate to provide focusing of soft x-rays in grazing incidence reflection. The substrate is bent to an elliptical shape with large curvature and high stresses in the substrate require a strong elas
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______325::135448cf2bda627fb0bc29ad454b1352
http://www.escholarship.org/uc/item/0hr2v5bt
http://www.escholarship.org/uc/item/0hr2v5bt
Autor:
Howells, Malcolm. R., Paquin, Roger A.
Publikováno v:
Proceedings of SPIE; 3/6/2017, Vol. 10289, p339-372, 34p
Publikováno v:
Proceedings of SPIE; Nov2009, Issue 1, p744809-744809-8, 8p
Autor:
Yashchuk, Valeriy V., Franck, Andrew D., Irick, Steve C., Howells, Malcolm R., MacDowell, Alastair A., McKinney, Wayne R.
Publikováno v:
Proceedings of SPIE; Nov2005 Part 2, Issue 1, p58580A-58580A-12, 12p
Autor:
Yashchuk, Valeriy V., Irick, Steve C., Gullikson, Eric M., Howells, Malcolm R., MacDowell, Alastair A., McKinney, Wayne R., Salmassi, Farhad, Warwick, Tony
Publikováno v:
Proceedings of SPIE; Nov2005 Part 2, Issue 1, p59210G-59210G-12, 12p