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pro vyhledávání: '"Hovik Musayelyan"'
Autor:
Vazgen Melikyan, Harutyun Stepanyan, Gayane Markosyan, Hovik Musayelyan, Armen Durgaryan, Karen Sloyan, Abraham Balabanyan
Publikováno v:
VLSI-SoC
Methods of CMOS resistance process voltage temperature variation detection and compensation are described. Two different approaches are proposed and comparative analysis is performed. The first solution makes use of an external precise resistor as a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::35a21c9c2a0f65d3f798f60be9de0671
https://doi.org/10.1109/vlsi-soc.2013.6673301
https://doi.org/10.1109/vlsi-soc.2013.6673301
