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Automated experiments in scanning transmission electron microscopy (STEM) require rapid image segmentation to optimize data representation for human interpretation, decision-making, site-selective spectroscopies, and atomic manipulation. Currently, s
Externí odkaz:
http://arxiv.org/abs/2409.12462
Autor:
Houston, Austin C, Harris, Sumner B, Hachtel, Jordan A, Yu, Yiling, Geohegan, David B, Xiao, Kai, Duscher, Gerd
Publikováno v:
Microscopy & Microanalysis; 2024 Supplement, Vol. 30, p1-4, 4p