Výsledky vyhledávání - "Hourani , Wael"

Covalently-bounded nano-architectures by on-surface photopolymerization

Autor: Custovic, Irma, Hourani, Wael, Teyssieux, Damien, JEANNOUTOT, Judicaël, Feron, Michel, Makoudi, Younes, Palmino, Frank, Cherioux, Frédéric

Publikováno v: European Materials Research Society
European Materials Research Society, Jun 2018, Strasbourg, France

International audience; Abstract : The fabrication of robust and conjugated organic nano-architectures deposited on surfaces is a key-challenge in order to build smart components. Most of covalent nano-architectures are obtained by thermally-induced

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::c72dd3cc15f46e722e668ea5da134c32
https://hal.archives-ouvertes.fr/hal-02130174

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Soluble Two-Dimensional Covalent Organometallic Polymers by(Arene)Ruthenium-Sulfur Chemistry

Autor: Coraux, Johann, Hourani, Wael, Muller, Valentin, Bendiab, Nedjma, Den Hertog, Martien, Salut, Roland, Cherioux, Frédéric

Publikováno v: 1st European Conference on Chemistry of Two-Dimensional Materials (Chem2DMat)
1st European Conference on Chemistry of Two-Dimensional Materials (Chem2DMat), Aug 2017, Strasbourg, France

International audience; Conjugated two-dimensional (2D) materials are ultimately thin species, in which the hoping of charge carriers between neighboring atomic sites governs conduction. Graphene, which may be regarded as a giant conjugated molecule,

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::c6e07fa17c0669f15010dbd41b08220d
https://hal.archives-ouvertes.fr/hal-02300615

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The needs and challenges of electrical measurements for micro/nanoelectronic devices

Autor: Gautier, Brice, Martin, Simon, Hourani, Wael, Grandfond, Antonin, BABOUX, Nicolas, Albertini, David

Publikováno v: Consultative Committee for Electricity and Magnetism workshop
Consultative Committee for Electricity and Magnetism workshop, Jan 2017, Paris, France

23 mars 2017; International audience; no abstract

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::b597c6696fa54a65b98a0a56c79e9229
https://hal.archives-ouvertes.fr/hal-01701487

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Akademický článek

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Dissertation/ Thesis

Caractérisation des courants de fuite à l'échelle nanométrique dans les couches ultra-minces d'oxydes pour la microélectronique

Autor: Hourani, Wael

La miniaturisation de la structure de transistor MOS a conduit à l'amincissement de l’oxyde de grille. Ainsi, la dégradation et le claquage sous contrainte électrique est devenu l'un des problèmes de fiabilité les plus importants des couches m

Externí odkaz: http://www.theses.fr/2011ISAL0109/document

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Caractérisation des courants de fuite à l'échelle nanométrique dans les couches ultra-minces d'oxydes pour la microélectronique

Autor: Hourani , Wael

Publikováno v: Other. INSA de Lyon, 2011. English. ⟨NNT : 2011ISAL0109⟩
Other. INSA de Lyon, 2011. English. 〈NNT : 2011ISAL0109〉

Miniaturization of the MOS transistor structure has led to the high thinning of the gate oxide. Hence, degradation and breakdown under electrical stress became one of the important reliability concerns of thin oxide films. The use of characterization

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::3f557d96d9fbc16603c45b658a49c701
https://tel.archives-ouvertes.fr/tel-00952841

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