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Autor:
Hou, Jin Zou, Chuan-Jian Li, Chen Zheng, Dong Wang, Jian Zhang, Xin Wang, Jun-Ying Zhang, Zhi-Ling
Publikováno v:
Sensors; Volume 23; Issue 12; Pages: 5469
Accurate measurement of the permittivity and loss tangent of low-loss materials is essential due to their special applications in the field of ultra large scale integrated circuits and microwave devices. In this study, we developed a novel strategy t