Zobrazeno 1 - 10
of 27
pro vyhledávání: '"Horst Schirmeier"'
Publikováno v:
2022 18th European Dependable Computing Conference (EDCC).
Autor:
Christian Hakert, Kuan-Hsun Chen, Horst Schirmeier, Lars Bauer, Paul R. Genssler, Georg von der Brüggen, Hussam Amrouch, Jörg Henkel, Jian-Jia Chen
Publikováno v:
ACM Transactions on Embedded Computing Systems, 21 (1), Art.-Nr.: 5
In-memory wear-leveling has become an important research field for emerging non-volatile main memories over the past years. Many approaches in the literature perform wear-leveling by making use of special hardware. Since most non-volatile memories on
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f25a3101efeb777770bcfc35ea3f36be
https://publikationen.bibliothek.kit.edu/1000143507/148459462
https://publikationen.bibliothek.kit.edu/1000143507/148459462
Autor:
Arthur Martens, Daniel Lohmann, Martin Hoffmann, Christoph Borchert, Horst Schirmeier, Rüdiger Kapitza, Christian Dietrich, Olaf Spinczyk
Publikováno v:
Henkel J., Dutt N. (eds) Dependable Embedded Systems. Embedded Systems. Springer, Cham.: 85-116 (2021)
Dependable Embedded Systems ISBN: 9783030520168
Dependable Embedded Systems ISBN: 9783030520168
As all conceptual layers in the software stack depend on the operating system (OS) to reliably provide resource-management services and isolation, it can be considered the “reliable computing base” that must be hardened for correct operation unde
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a46d240096cccdff150bc3fa8c7a1d02
https://hdl.handle.net/11420/9226
https://hdl.handle.net/11420/9226
Quantitative Cross-Layer Evaluation of Transient-Fault Injection Techniques for Algorithm Comparison
Autor:
Horst Schirmeier, Mark Breddemann
Publikováno v:
EDCC
In the wake of the soft-error problem, fault injection (FI) is a standard methodology to measure fault resilience of programs and to compare algorithm variants. As detailed, e.g. gate-level machine models are often unavailable or too slow to simulate
Publikováno v:
EuroSys
For fine-grained synchronization of application and kernel threads, the Linux kernel provides a multitude of different locking mechanisms that are being used on various individually locked data structures. Understanding which locks are required in wh
Publikováno v:
DATE
In the field of automotive engineering, broadcast buses, e.g., Controller Area Network (CAN), are frequently used to connect multiple electronic control units (ECUs). Each message transmitted on such buses can be received by each single participant,
Autor:
Martin Hoffmann, Horst Schirmeier, Olaf Spinczyk, Christian Dietrich, Daniel Lohmann, Paolo Rech, Christoph Borchert, Thiago Santini, Flávio Rech Wagner
Publikováno v:
Architecture of Computing Systems-ARCS 2017 ISBN: 9783319549989
ARCS
ARCS
For decades, radiation-induced failures have been a known issue for aero-space systems, in which redundancy mechanisms are employed as a protection method. Due to the shrinking of structures and operating voltages, these failures are increasingly bec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::61a377442aa847d7083f18888aabf278
https://doi.org/10.1007/978-3-319-54999-6_1
https://doi.org/10.1007/978-3-319-54999-6_1
Autor:
Wolfgang Schröder-Preikschat, Martin Hoffmann, Christian Dietrich, Daniel Lohmann, Peter Ulbrich, Horst Schirmeier
Publikováno v:
Software Quality Journal. 24:87-113
Arithmetic error coding schemes are a well-known and effective technique for soft-error mitigation. Although the underlying coding theory is generally a complex area of mathematics, its practical implementation is comparatively simple in general. How
Autor:
Horst Schirmeier, Olaf Spinczyk, Martin Hoffmann, Daniel Lohmann, Michael Lenz, Christian Dietrich
Publikováno v:
EDCC
Due to voltage and structure shrinking, the influence of radiation on a circuit's operation increases, resulting in future hardware designs exhibiting much higher rates of soft errors. Software developers have to cope with these effects to ensure fun
Publikováno v:
DSN
Since the first identification of physical causes for soft errors in memory circuits, fault injection (FI) has grown into a standard methodology to assess the fault resilience of computer systems. A variety of FI techniques trying to mimic these phys