Zobrazeno 1 - 10
of 208
pro vyhledávání: '"Hopstaken, M."'
Autor:
Czornomaz, L., El Kazzi, M., Hopstaken, M., Caimi, D., Mächler, P., Rossel, C., Bjoerk, M., Marchiori, C., Siegwart, H., Fompeyrine, J.
Publikováno v:
In Solid State Electronics August 2012 74:71-76
Autor:
Gassilloud, R., Martin, F., Leroux, C., Hopstaken, M., Garros, X., Cassé, M., Reimbold, Gilles, Billon, Thierry, Bensahel, Daniel
Publikováno v:
In Microelectronic Engineering 2009 86(3):263-267
Autor:
Imbert, B., Guichet, C., Bonnetier, S., Zoll, S., Juhel, M., Hopstaken, M., Clifton, P., Thomas, O.
Publikováno v:
In Microelectronic Engineering 2007 84(11):2523-2527
Autor:
Gras, R., Gosset, L.G., Petitprez, E., Girault, V., Hopstaken, M., Jullian, S., Imbert, G., Le Friec, Y., Bienacel, J., Guillan, J., Chevolleau, T., Sherman, S., Tabat, M., Hautala, J., Torres, J.
Publikováno v:
In Microelectronic Engineering 2007 84(11):2675-2680
Autor:
Gras, R., Gosset, L.G., Hopstaken, M., Bouyssou, R., Chevolleau, T., Petitprez, E., Girault, V., Jullian, S., Guillan, J., Imbert, G., Fossati, D., Le Friec, Y., Torres, J.
Publikováno v:
In Microelectronic Engineering 2007 84(9):2184-2187
Publikováno v:
In Applied Surface Science 2006 252(19):7211-7213
Autor:
Vitiello, J., Ducote, V., Farcy, A., Gosset, L.G., Le-Friec, Y., Hopstaken, M., Jullian, S., Cordeau, M., Ailhas, C., Chapelon, L.L., Barbier, D., Veillerot, M., Danel, A., Torres, J.
Publikováno v:
In Microelectronic Engineering 2006 83(11):2130-2135
Autor:
Chhun, S., Gosset, L.G., Michelon, J., Girault, V., Vitiello, J., Hopstaken, M., Courtas, S., Debauche, C., Bancken, P.H.L., Gaillard, N., Bryce, G., Juhel, M., Pinzelli, L., Guillan, J., Gras, R., Van Schravendijk, B., Dupuy, J.-C., Torres, J.
Publikováno v:
In Microelectronic Engineering 2006 83(11):2094-2100
Autor:
Chhun, S., Gosset, L.G., Casanova, N., Ney, D., Delille, D., Trouiller, C., Hopstaken, M., Chausse, P., Grégoire, M., Gautier, B., Dupuy, J.-C., Torres, J.
Publikováno v:
In Microelectronic Engineering 2005 82(3):587-593
Autor:
Meunier-Beillard, P, Caymax, M, Van Nieuwenhuysen, K, Doumen, G, Brijs, B, Hopstaken, M, Geenen, L, Vandervorst, W
Publikováno v:
In Applied Surface Science 2004 224(1):31-35