Zobrazeno 1 - 10
of 125
pro vyhledávání: '"Hook, T.B."'
Publikováno v:
In Microelectronic Engineering 17 June 2005 80:126-129
Autor:
Hook, T.B., Burnham, J.S.
Publikováno v:
IBM Journal of Research & Development. May99, Vol. 43 Issue 3, p393. 14p. 4 Diagrams, 2 Charts, 10 Graphs.
Autor:
Hook, T.B.
Publikováno v:
2008 IEEE International Conference on Integrated Circuit Design & Technology & Tutorial; 2008, p83-86, 4p
Publikováno v:
2006 IEEE International Conference on IC Design & Technology; 2006, p1-4, 4p
Publikováno v:
2005 International Conference on Integrated Circuit Design & Technology, 2005. ICICDT 2005; 2005, p167-170, 4p
Autor:
Hook, T.B.
Publikováno v:
2005 International Conference on Integrated Circuit Design & Technology, 2005. ICICDT 2005; 2005, p87-90, 4p
Publikováno v:
2004 International Conference on Integrated Circuit Design & Technology (IEEE Cat. No.04EX866); 2004, p127-130, 4p
The effect of fluorine in an advanced CMOS process with triple (1.6/2.2/5.2 nm) nitrided gate oxide.
Publikováno v:
2003 8th International Symposium Plasma- & Process-Induced Damage; 2003, p150-153, 4p
Publikováno v:
7th International Symposium on Plasma & Process-Induced Damage; 2002, p10-13, 4p
Publikováno v:
2001 6th International Symposium on Plasma- & Process-Induced Damage (IEEE Cat. No.01TH8538); 2001, p104-107, 4p