Zobrazeno 1 - 10
of 15
pro vyhledávání: '"Hongzhou Yan"'
Publikováno v:
Nuclear Materials and Energy, Vol 41, Iss , Pp 101801- (2024)
Failure typically occurs during sintering due to high thermal stress and poor strength of LiH ceramics. The short sintering time has shown to be beneficial in preventing excessive grain growth and improving ceramic performance. In this study, we buil
Externí odkaz:
https://doaj.org/article/84707e3dbd1c4edc957b11f8bb424d26
Publikováno v:
Journal of Materials Research and Technology, Vol 28, Iss , Pp 4116-4130 (2024)
The laser welding technology of ultra-thick plates has been widely applied in many crucial engineering structures, where its safety and stability still suffer from the residual stress brought by the welding temperature. In this work, experimental and
Externí odkaz:
https://doaj.org/article/6fb01c6721f34fddbb4b636c48b83819
Publikováno v:
Zhongguo Jianchuan Yanjiu, Vol 18, Iss 1, Pp 163-169 (2023)
ObjectiveIn order to clarify the interference of ship movement on the radar cross section (RCS) measurement statistics of a real ship, the statistical characteristics of ship body X-band RCS under various motion states are analyzed.MethodsA dynamic R
Externí odkaz:
https://doaj.org/article/744bb781a03e4f8ba8cf4ca35b94ba54
Publikováno v:
2022 IEEE 5th Advanced Information Management, Communicates, Electronic and Automation Control Conference (IMCEC).
Publikováno v:
2022 IEEE 6th Information Technology and Mechatronics Engineering Conference (ITOEC).
Publikováno v:
2021 IEEE 5th Information Technology,Networking,Electronic and Automation Control Conference (ITNEC).
Structured-illumination microscopy (SIM) is a novel instrument for measuring surface topography. After images captured by SIM, optical-sectioned images can be acquired by sectioned by section algorithm. Finally, the peak point can be obtained by gaus
Publikováno v:
Tenth International Symposium on Precision Engineering Measurements and Instrumentation.
In this paper, a structural illumination based technology for microscopic surface topography measurement is investigated, in which only one shot structural illumination image is grabbed and a more efficient optical sectioned image reconstruction algo
Publikováno v:
Tenth International Symposium on Precision Engineering Measurements and Instrumentation.
Currently the diode laser is widely used in the field of optoelectronics, especially in precise measurement based on laser-interferometry. Laser wavelength stability is a property that critical to the measurement. Since the laser wavelength is easy t
Publikováno v:
Journal of Power Sources. 250:174-180
CdS quantum dots (QDs) sensitized highly oriented two-end-opened TiO 2 nanotubes array membrane solar cells have been fabricated in this paper. The structure, morphology and composition of the photoanodes have been characterized by XRD, SEM, TEM and
Publikováno v:
Proceedings of SPIE; 4/26/2019, Vol. 11053, p1-6, 6p