Zobrazeno 1 - 10
of 21
pro vyhledávání: '"Honguh Yoshinori"'
Publikováno v:
Journal of Chemical Physics; 11/15/1985, Vol. 83 Issue 10, p5052, 8p
Publikováno v:
Journal of Chemical Physics; 12/15/1987, Vol. 87 Issue 12, p6995, 6p
Autor:
Honguh, Yoshinori1, Murakami, Teruo1
Publikováno v:
Electronics & Communications in Japan, Part 3: Fundamental Electronic Science. Jan1994, Vol. 77 Issue 1, p85-94. 10p.
Publikováno v:
2008 16th IEEE International Conference on Advanced Thermal Processing of Semiconductors.
In the optical annealing process, temperature distributions of chips on a silicon wafer tend to be inhomogeneous. One of sources to generate the temperature inhomogeneities should be an optical interference effect of the incident lights where the inc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7ce278b38e769a21343ed8d8b7192648
https://doi.org/10.1109/rtp.2008.4690542
https://doi.org/10.1109/rtp.2008.4690542
Publikováno v:
Proceedings of SPIE; Nov2007 Part 2, Issue 1, p66072J-66072J-9, 9p
Autor:
Shiratsuchi, Masataka, Honguh, Yoshinori, Hirano, Ryoichi, Ogawa, Riki, Hirono, Masatoshi, Nomura, Takehiko
Publikováno v:
Proceedings of SPIE; Nov2007 Part 2, Issue 1, p67304W-67304W-11, 11p
Autor:
Ogawa, Riki, Sugihara, Shinji, Honguh, Yoshinori, Nagahama, Hiroyuki, Watanabe, Toshiyuki, Tsuchiya, Hideo
Publikováno v:
Proceedings of SPIE; Nov2003, Issue 1, p965-972, 8p
Diffraction analysis of optical-disk readout signal deterioration caused by mark-profile fluctuation
Autor:
Honguh, Yoshinori
Publikováno v:
Applied Optics; February 1994, Vol. 33 Issue: 5 p857-862, 6p