Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Hongjuan Shao"'
Publikováno v:
IEEE Access, Vol 12, Pp 90418-90431 (2024)
Compressed sensing theory is widely used to accurately reconstruct the original signal from a small number of random observations, i.e., obtain high-dimensional information from low-dimensional information. This feature has shown effectiveness in ima
Externí odkaz:
https://doaj.org/article/031637c6e94f44ef95232beda1d07021
Publikováno v:
Remote Sensing, Vol 15, Iss 20, p 4914 (2023)
In the realm of remote sensing image analysis, the task of road extraction poses significant complexities, especially in the context of intricate scenes and diminutive targets. In response to these challenges, we have developed a novel deep learning
Externí odkaz:
https://doaj.org/article/4dc67dca6dac49898aaa0f3bd0fb3914
Publikováno v:
Materials, Vol 13, Iss 19, p 4325 (2020)
TiO2 possesses a wide forbidden band of about 3.2 eV, which severely limits its visible light absorption efficiency. In this work, copper nitride (Cu3N) films were prepared by magnetron sputtering at different gas flow ratios. The structure of the fi
Externí odkaz:
https://doaj.org/article/ef20ea0a6b934ba79cc0049a24004511
Publikováno v:
Materials, Vol 13, Iss 4325, p 4325 (2020)
Materials
Volume 13
Issue 19
Materials
Volume 13
Issue 19
TiO2 possesses a wide forbidden band of about 3.2 eV, which severely limits its visible light absorption efficiency. In this work, copper nitride (Cu3N) films were prepared by magnetron sputtering at different gas flow ratios. The structure of the fi
Publikováno v:
Chemical Physics Letters. 583:185-189
The linear and third-order nonlinear optical properties of four polymethine cyanines (PC-1–PC-4) were investigated by UV–visible absorption spectroscopy and degenerate four-wave mixing (DFWM) technique. The second-order hyperpolarizabilities γ o
Publikováno v:
Integrated Ferroelectrics. 135:8-16
Copper nitride (Cu3N) films were prepared by a reactive radio frequency magnetron sputtering apparatus. The surface morphology and microstructure of pure and Ti doped Cu3N films were characterized by atomic force microscope (AFM) and X-ray diffractio