Zobrazeno 1 - 10
of 12
pro vyhledávání: '"Hong-Jie Dong"'
Publikováno v:
Results in Physics, Vol 28, Iss , Pp 104554- (2021)
The universal formulae for λ(χreal, Eg, T) and λ(χreal, Eg, T)p of insulator having less impurities are experimentally proved, where λ(χreal, Eg, T) is the mean escape depth at Kelvin temperature T of secondary electrons emitted from insulators
Externí odkaz:
https://doaj.org/article/a0339fc779214ca8bcabd7b632690e58
Publikováno v:
Results in Physics, Vol 26, Iss , Pp 104350- (2021)
This paper studies an electron-induced secondary electron model ESEM for photoelectric sensitivity PS and quantum efficiency QE of metal surfaces near threshold frequency γ0, which was developed from Sommerfeld’s theory and the theories of transpo
Externí odkaz:
https://doaj.org/article/6664ae4497a3417ab51730bfeb78dba7
Publikováno v:
Results in Physics, Vol 20, Iss , Pp 103745- (2021)
Based on expression of primary range R and the R at Epo ≥ 10.0 keV and L at Epo ≥ 1.0 keV calculated by ESTAR program [1], the method of obtaining formula for R at Epo ≥ 1.0 keV is presented; where Epo is incident energy of primary electron, an
Externí odkaz:
https://doaj.org/article/b83af9c2ec364a54a9bb67aa700b8dd3
Publikováno v:
Nuclear Science and Techniques. 33
Publikováno v:
Chinese Physics B. 32:048102
The formulae for parameters of a negative electron affinity semiconductor (NEAS) with large mean escape depth of secondary electrons λ (NEASLD) are deduced. The methods for obtaining parameters such as λ, B, E pom and the maximum δ and δ at 100.0
Publikováno v:
SSRN Electronic Journal.
Publikováno v:
Results in Physics, Vol 28, Iss, Pp 104554-(2021)
The universal formulae for λ(χreal, Eg, T) and λ(χreal, Eg, T)p of insulator having less impurities are experimentally proved, where λ(χreal, Eg, T) is the mean escape depth at Kelvin temperature T of secondary electrons emitted from insulators
Publikováno v:
SSRN Electronic Journal.
Publikováno v:
SSRN Electronic Journal.