Zobrazeno 1 - 10
of 18
pro vyhledávání: '"Hong goo Kim"'
Autor:
Gyumin Lim, Kenneth David Kihm, Hong Goo Kim, Woorim Lee, Woomin Lee, Kyung Rok Pyun, Sosan Cheon, Phillip Lee, Jin Young Min, Seung Hwan Ko
Publikováno v:
Nanomaterials, Vol 8, Iss 7, p 557 (2018)
The grain size of CVD (Chemical Vapor Deposition) graphene was controlled by changing the precursor gas flow rates, operation temperature, and chamber pressure. Graphene of average grain sizes of 4.1 µm, 2.2 µm, and 0.5 µm was synthesized in high
Externí odkaz:
https://doaj.org/article/24385b3b06944b559cbf2786c4ed57aa
Autor:
Kyung Rok Pyun, Seung Hwan Ko, Woomin Lee, Kenneth David Kihm, Sinchul Yeom, Hong Goo Kim, Woorim Lee, Seungha Shin, Gyumin Lim, Sosan Cheon
Publikováno v:
Carbon. 138:98-107
The in-plane thermal conductivity ( k S i G ) of silicon-doped graphene (SiG) was greatly suppressed primarily due to increased phonon scattering associated with the large mass difference of Si from its host C atoms. For SiG as supported on an 8 nm-t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e209f61657f122d207436e6512d3f757
https://doi.org/10.1016/j.carbon.2018.05.064
https://doi.org/10.1016/j.carbon.2018.05.064
Autor:
Kyung Rok Pyun, Woomin Lee, Seung Hwan Ko, Hong Goo Kim, Woorim Lee, Seungha Shin, Gyumin Lim, Sosan Cheon, Kenneth David Kihm
Publikováno v:
Carbon. 125:39-48
Measuring the thermal conductivity kg of supported graphene is inherently complicated due to uncertainties associated with the heat dissipation into the substrate. We innovate the use of an ultra-thin 8-nm SiO2 substrate to alleviate these uncertaint
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d3ee5a843966c404f2e3a140a8ed2679
https://doi.org/10.1016/j.carbon.2017.09.033
https://doi.org/10.1016/j.carbon.2017.09.033
Autor:
Seung Hwan Ko, Hong Goo Kim, Woorim Lee, Gyumin Lim, Sosan Cheon, Phillip Lee, Jin Young Min, Kyung Rok Pyun, Woomin Lee, Kenneth David Kihm
Publikováno v:
Nanomaterials, Vol 8, Iss 7, p 557 (2018)
Nanomaterials
Volume 8
Issue 7
Nanomaterials
Volume 8
Issue 7
The grain size of CVD (Chemical Vapor Deposition) graphene was controlled by changing the precursor gas flow rates, operation temperature, and chamber pressure. Graphene of average grain sizes of 4.1 µ
m, 2.2 µ
m, and 0.5 µ
m, 2.2 µ
m, and 0.5 µ
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c048d42db5dce54dc24ba5ae6907fa73
Autor:
Gwangseok Hwang, Hong Goo Kim, Jaehun Chung, Joon Sik Lee, Kichul Yoon, Ohmyoung Kwon, Kenneth D. Kihm
Publikováno v:
Carbon. 76:77-83
Despite the importance of the accurate measurement of the thermal conductivity of graphene, deviations in previous data are still quite large due to the low signal-to-noise ratio in the measurement of graphene temperature, the uncertainties in the me
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f2d52c285b59c12ea97b8e248dbddd4f
https://doi.org/10.1016/j.carbon.2014.04.051
https://doi.org/10.1016/j.carbon.2014.04.051
Autor:
Kyung Rok Pyun, Mi Kyung Han, Woomin Lee, Kenneth D. Kihm, Seung Hwan Ko, Hong Goo Kim, Woorim Lee, Sosan Cheon, Gyumin Lim, Sung Jin Kim
Publikováno v:
Advanced Materials Interfaces. :1900275
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f6cf00bc8bee8bdf346e9e190c267be1
https://doi.org/10.1002/admi.201900275
https://doi.org/10.1002/admi.201900275
Autor:
Jae Sik Jin, Sosan Cheon, Hong Goo Kim, Woorim Lee, Kyung Rok Pyun, Tielin Li, Kenneth D. Kihm, Woomin Lee, Sung-Hoon Ahn, Seung Hwan Ko, Gyumin Lim, Hyun-Taek Lee
Publikováno v:
Applied Physics Letters. 114:051905
The detrimental effect of nanoscale hole defects on the in-plane thermal conductivity (k) was first examined for supported CVD graphene. A focused ion beam punctured equally spaced 50-nm diameter holes with different hole spacings (200, 400, and 800
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4980d9c06ed46b16c43a68fcd075b4f8
https://doi.org/10.1063/1.5049713
https://doi.org/10.1063/1.5049713
Publikováno v:
Scientific Reports
SCIENTIFIC REPORTS(4)
SCIENTIFIC REPORTS(4)
Reliable determination of the complex refractive index (RI) of graphene inherently requires two independent measurement realizations for two independent unknowns of the real (n(G)) and imaginary (k(G)) components, i.e., RI = n(G) + i k(G). Thus, any
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::aa2b71ea6aa99e60df387123efd263b9
https://pubmed.ncbi.nlm.nih.gov/25219628
https://pubmed.ncbi.nlm.nih.gov/25219628
Autor:
Woomin Lee, Kihm, Kenneth David, Hong Goo Kim, Seungha Shin, Changhyuk Lee, Jae Sung Park, Sosan Cheon, Oh Myoung Kwon, Gyumin Lim, Woorim Lee
Publikováno v:
Nano Letters; Apr2017, Vol. 17 Issue 4, p2361-2366, 6p
Publikováno v:
Scientific Reports; 9/19/2014, p1-8, 8p