Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Hong Chol Chae"'
Autor:
Byeong Jun Cha, Yujing Ji, Chang Min Choi, Daesung Jung, Chan-Cuk Hwang, Hong Chol Chae, Myoung Choul Choi, Hyun Ook Seo, Young Dok Kim
Publikováno v:
The Journal of Physical Chemistry C. 126:13686-13697
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::61ce223b311022b4da52213d1589d7bc
https://doi.org/10.1021/acs.jpcc.2c03504
https://doi.org/10.1021/acs.jpcc.2c03504
Akademický článek
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Autor:
Tahir, Dahlang, Ilyas, Sultan, Rahmat, Roni, Heryanto, Heryanto, Fahri, Ahmad Nurul, Rahmi, Mufti Hatur, Abdullah, Bualkar, Hong, Chol Chae, Kang, Hee Jae
Publikováno v:
ACS Omega; 10/26/2021, Vol. 6 Issue 42, p28334-28346, 13p
Publikováno v:
Korean Journal of Metals and Materials. 53:642-647
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cc05913ccd709d0f68fac6f84745e787
https://doi.org/10.3365/kjmm.2015.53.9.642
https://doi.org/10.3365/kjmm.2015.53.9.642
Autor:
Hee-Joon Kang, Jong-Hyun Kim, Hong-Chol Chae, Kungwon Rhie, Sungjung Joo, Dong-Seok Kim, B. C. Lee, Kwang-Tae Jung, Youngjae Jang
Publikováno v:
Journal of the Korean Physical Society. 67:901-905
Amorphous FeZr was dusted in CoFeB/MgO/CoFeB magnetic tunnel junctions (MTJs), and the effects on tunnel phenomena were investigated. As the thickness of the FeZr layer between the CoFeB and the MgO layers increased, the resistance increased rapidly
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::091e3690d7cddfd8198dfbdc58bb1b0b
https://doi.org/10.3938/jkps.67.901
https://doi.org/10.3938/jkps.67.901
Publikováno v:
Journal of Surface Analysis. 22:97-103
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::36daf756554a9abd922e0206eb2999a1
https://doi.org/10.1384/jsa.22.97
https://doi.org/10.1384/jsa.22.97
Autor:
Hee Jae Kang, Hong-Chol Chae, Jong Shik Jang, Hye Hyen Hwang, Kyung Joong Kim, Yong-Duck Chung
Publikováno v:
Applied Surface Science. 282:777-781
a b s t r a c t Quantitative analysis of Cu(In,Ga)Se2 (CIGS) films with non-uniform depth distributions was investi- gated by Auger electron spectroscopy (AES) depth profiling. The atomic fractions of the CIGS films were measured by relative sensitiv
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::40034ec27a8da308b278657dc5445a78
https://doi.org/10.1016/j.apsusc.2013.06.052
https://doi.org/10.1016/j.apsusc.2013.06.052
Autor:
Joo Wha Hong, Hong-Chol Chae
Publikováno v:
Korean Journal of Metals and Materials. 50:545-548
The optical and electronic properties of Indium Tin Oxide (ITO) thin films deposited on a RFplasma treated glass substrate were investigated by X-Ray Photoelectron Spectroscopy (XPS), Ultra-violet Photoelectron Spectroscopy (UPS), Reflected Electron
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d76b4e808e8609feaf335754ba5011d0
https://doi.org/10.3365/kjmm.2012.50.7.545
https://doi.org/10.3365/kjmm.2012.50.7.545