Improving yield learning by rapid electrical fault inspection and localization.

Autor: Kim, Beomjun, Hong, Jongtaek, Han, Yongwoon, Kapilevich, Izak, Block, Jeff, Lundquist, Ted, Kim, Myung Hwan

Publikováno v: 2012 19th IEEE International Symposium on the Physical & Failure Analysis of Integrated Circuits; 1/ 1/2012, p1-5, 5p