Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Hojin Yoon"'
Publikováno v:
IEEE Access, Vol 12, Pp 5684-5707 (2024)
The central perspective of this review is to categorize research in Human Motion Recognition (HMR) over the past decade into two significant categories: vision sensor-based (VS) methods and wearable sensor-based (WS) methods. Within each category, re
Externí odkaz:
https://doaj.org/article/796a01c5a0d84bfe85c8791ad7ab720d
Autor:
David Wilson, Andrew Ishizuka, Geoffrey Lynn, Qiuyin Ren, Yaling Zhu, Hojin Yoon, Sloane Fussell, Robert Seder
Publikováno v:
Journal for ImmunoTherapy of Cancer, Vol 11, Iss Suppl 1 (2023)
Externí odkaz:
https://doaj.org/article/f58aecf6a97440ad953bdf206f3650ad
Autor:
Hojin Yoon, Moohyun Ahn, Byeongsu Yang, Youngjae Lee, DongLak Kim, Heejun Park, Byeonghun Min, Jonghee Yoo
Publikováno v:
Physical Review
We report details on the axion dark matter search experiment that uses the innovative technologies of a High-Temperature Superconducting (HTS) magnet and a Josephson Parametric Converter (JPC). An 18 T HTS solenoid magnet is developed for this experi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::628fbbc9354ebc6fe93bd5c01b535f0c
http://arxiv.org/abs/2206.12271
http://arxiv.org/abs/2206.12271
Autor:
Youngjae Lee, Byeongsu Yang, Hojin Yoon, Moohyun Ahn, Heejun Park, Byeonghun Min, DongLak Kim, Jonghee Yoo
Publikováno v:
Physical Review Letters
We report the first search results for axion dark matter using an 18\,T high-temperature superconducting magnet haloscope. The scan frequency ranges from 4.7789 to 4.8094\,GHz. No significant signal consistent with the Galactic halo dark matter axion
Publikováno v:
Journal of Clinical Neurology. 19:315
Autor:
Eli, Fastow, Sean, Cook, Pablo, Dean, Patrick, Ott, Jonathan, Wilson, Hojin, Yoon, Travis, Dietz, Fred, Bateman, Mohamad, Al-Sheikhly
Publikováno v:
Radiation research. 192(2)
Primary amines form a key component of a well-studied mechanism for capturing carbon dioxide (CO
Autor:
Jong Duk Lee, Il Han Park, Byung-Gook Park, Seunggun Seo, Sangwoo Kang, Sungnam Chang, Yongwook Song, Hojin Yoon, Daewoong Kang, Wonseong Lee, Dongwon Chang, Eun-Jung Lee, Hyungcheol Shin
Publikováno v:
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.
One of the most important issues of NAND flash memory is reliability problems caused by oxide and interface traps. But it has been revealed that their generation rate increases by Fowler-Nordheim current stressing on the tunnel oxide as the channel w
Autor:
Daewoong Kang, Sungnam Chang, Seunggun Seo, Yongwook Song, Hojin Yoon, Eunjung Lee, Dongwon Chang, Wonseong Lee, Byung-Gook Park, Jong Duk Lee, Il Han Park, Sangwoo Kang, Hyungcheol Shin
Publikováno v:
2007 IEEE International Reliability Physics Symposium Proceedings 45th Annual; 2007, p652-653, 2p