Zobrazeno 1 - 10
of 12
pro vyhledávání: '"Hogyeong Kim"'
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41:2739-2752
With technological advancements, the density and capacity of memory are rapidly increasing. As the number of memory cells increases, the difficulty of fault analysis and the number of faults also increase. Hence, the yield and test cost of memory hav
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ad3651a238ee274711ad373746883de3
https://doi.org/10.1109/tcad.2021.3109859
https://doi.org/10.1109/tcad.2021.3109859
Publikováno v:
Materials, Vol 14, Iss 4, p 932 (2021)
In various fields such as the 5G antenna system and satellite communication system, there is a growing demand to develop a smart antenna with a frequency selective or beamforming function within a limited space. While antennas utilizing mechanical, e
Externí odkaz:
https://doaj.org/article/bc1cd6b806d64abda235a17affaafede
Publikováno v:
Materials, Vol 14, Iss 932, p 932 (2021)
Materials; Volume 14; Issue 4; Pages: 932
Materials
Materials; Volume 14; Issue 4; Pages: 932
Materials
In various fields such as the 5G antenna system and satellite communication system, there is a growing demand to develop a smart antenna with a frequency selective or beamforming function within a limited space. While antennas utilizing mechanical, e
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ddf195faa117372e7bff6d8d53e34709
https://www.mdpi.com/1996-1944/14/4/932
https://www.mdpi.com/1996-1944/14/4/932
Publikováno v:
ISOCC
Nanotechnology is considered important as an alternative technology to overcome the limitations of CMOS technology. While nanotechnology has advantages in terms of power, density and performance, it is essential to obtain defect tolerance using recon
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2a3923fed32b34d7ec5ec9f56297d3c7
https://doi.org/10.1109/isocc50952.2020.9332927
https://doi.org/10.1109/isocc50952.2020.9332927
Publikováno v:
ISOCC
As the probability of fault occurrence increases with the advance of memory density and capacity, redundancy analysis (RA) is widely used for memory yield. However, the conventional RAs progress unnecessary solution search stages since they are appli
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1e03653767cfdcd451f44ad28ba8334e
https://doi.org/10.1109/isocc50952.2020.9332931
https://doi.org/10.1109/isocc50952.2020.9332931
Publikováno v:
ITC-Asia
Since the probability of fault occurrence on memory has increased with the advance of memory density and capacity, memory repairs in wafer-level and package-level are widely used with redundancy analysis (RA) to improve memory yield. However, as the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::711c3cb7e80beeb18ffd9a0bf484c59d
https://doi.org/10.1109/itc-asia51099.2020.00028
https://doi.org/10.1109/itc-asia51099.2020.00028
Publikováno v:
Extreme Mechanics Letters. 36:100649
Although numerous soft actuators have been developed to generate diverse and dexterous morphing such as branching, bending, and twisting, continuum manipulation with increased degrees of freedom still relies on the coactivation of multiple actuators.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eedba52686f3e3f754078be0de429cba
https://doi.org/10.1016/j.eml.2020.100649
https://doi.org/10.1016/j.eml.2020.100649
Autor:
Choi, Moon-Young, Kim, Se-Um, Kim, Hogyeong, Kim, Kitae, Saeed, Mohsin Hassan, Pagidi, Srinivas, Na, Jun-Hee
Publikováno v:
Advanced Engineering Materials; Sep2023, Vol. 25 Issue 17, p1-7, 7p
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems; Aug2022, Vol. 41 Issue 8, p2739-2752, 14p
Publikováno v:
Clinical & Translational Oncology; Mar2020, Vol. 22 Issue 3, p279-282, 4p