Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Ho-cheol Jang"'
Publikováno v:
Transactions of the Korean Society for Noise and Vibration Engineering. 33:135-140
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::760e5b5802fcca751c0c439f8aefd84f
https://doi.org/10.5050/ksnve.2023.33.2.135
https://doi.org/10.5050/ksnve.2023.33.2.135
Autor:
Yae Jee Baek, Woo-Joong Kim, Jae-Hoon Ko, Youn-Jung Lee, Jin Young Ahn, Jung Ho Kim, Ho Cheol Jang, Hye Won Jeong, Yong Chan Kim, Yoon Soo Park, Sung-Han Kim, Kyong Ran Peck, Eui-Cheol Shin, Jun Yong Choi
Publikováno v:
Vaccine. 41:1694-1702
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::496bfe50a580ee9bf0946f970a860eb0
https://doi.org/10.1016/j.vaccine.2023.01.063
https://doi.org/10.1016/j.vaccine.2023.01.063
Autor:
Seung Hoon Lee, Eun-Kyoung Choi, Yun-Woong Paek, Jae-Hyung Kim, In-Chol Kang, Hyun-Chul Lee, Ho-Cheol Jang, Won-Mann Oh, Ho-Cheol Kang, Hyun-Jin Kim
Publikováno v:
International Immunopharmacology. 6:908-915
Nuclear factor-kappaB (NF-kappaB) is a transcription factor that plays crucial roles in inflammation and immunity. Understanding the positive and negative regulation of NF-kappaB activity is therefore of fundamental importance. A few previous studies
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::66ac68928df85a668eab60b094d3a7d5
https://doi.org/10.1016/j.intimp.2006.01.007
https://doi.org/10.1016/j.intimp.2006.01.007
Autor:
Ho Cheol Jang, Kye Bock Lee
Publikováno v:
Nuclear Engineering and Design. 172:351-357
Fully developed turbulent flows in closely spaced bare rod arrays have been studied numerically by using a nonlinear κ−ϵ model. This model permits inequality of the Reynolds normal stresses, a necessary condition for calculating turbulence-driven
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::085fc973841d67e2205713b7d68f940e
https://doi.org/10.1016/s0029-5493(97)00001-0
https://doi.org/10.1016/s0029-5493(97)00001-0
Autor:
Dal-Soo Kim, Dong-Nam Kim, Seung-Geun Kang, Nam-Yong Kim, Young-Chul Jo, Byung-Ju Lee, Jae-Hyung Kim, Ho-Cheol Jang
Publikováno v:
2010 34th IEEE/CPMT International Electronic Manufacturing Technology Symposium (IEMT).
The IC industry has been paid a large amount of quality cost for Electrical Overstress(EOS) damages. This paper described the failure analysis procedure to find EOS source and the experimental methodology to verify the failure mechanism in the subsys
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9f5bb2bbd82c46ff302ee7b88bc429f2
https://doi.org/10.1109/iemt.2010.5746676
https://doi.org/10.1109/iemt.2010.5746676
Publikováno v:
Proceedings of the 19th International Symposium on Power Semiconductor Devices and IC's.
Serious gate oscillation of power MOSFETs under avalanche condition has been observed, degrading an avalanche withstanding capability. Using experiments as well as numerical simulation, it is shown that this gate oscillation in avalanche mode results
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e72cb40f64fce180f4d48f63d02b09ef
https://doi.org/10.1109/ispsd.2007.4294945
https://doi.org/10.1109/ispsd.2007.4294945
Autor:
Jae-Hyung Kim, Dong-Nam Kim, Ho-Cheol Jang, Young-Chul Jo, Nam-Yong Kim, Seung-Geun Kang, Byung-Ju Lee, Dal-Soo Kim
Publikováno v:
2010 34th IEEE/CPMT International Electronic Manufacturing Technology Symposium (IEMT); 2010, p1-4, 4p
Publikováno v:
Proceedings of the 19th International Symposium on Power Semiconductor Devices & IC's; 2007, p113-116, 4p
Publikováno v:
Twenty Sixth IEEE/CPMT International Electronics Manufacturing Technology Symposium (Cat. No.00CH37146); 2000, p288-293, 6p
Publikováno v:
The Proceedings of the International Conference on Nuclear Engineering (ICONE). 2003:233
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::574db2ed3714c53be820948d125c1480
https://doi.org/10.1299/jsmeicone.2003.233
https://doi.org/10.1299/jsmeicone.2003.233