Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Ho-Nam Yoo"'
Autor:
Jiseong Im, Jaehyeon Kim, Ho-Nam Yoo, Jong-Won Baek, Dongseok Kwon, Seongbin Oh, Jangsaeng Kim, Joon Hwang, Byung-Gook Park, Jong-Ho Lee
Publikováno v:
IEEE Access, Vol 10, Pp 31263-31272 (2022)
Artificial Neural Networks (ANNs) have shown remarkable performance in various fields. However, ANN relies on the von-Neumann architecture, which consumes a lot of power. Hardware-based spiking neural networks (SNNs) inspired by a human brain have be
Externí odkaz:
https://doaj.org/article/e08780653d1f45ceb66ccb75e2463b25
Publikováno v:
IEEE Transactions on Electron Devices. 69:6717-6721
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b67dc8c97729f2417bf7ef20a3298297
https://doi.org/10.1109/ted.2022.3216537
https://doi.org/10.1109/ted.2022.3216537
Autor:
Min-Kyu Park, Ho-Nam Yoo, Joon Hwang, Sung Yun Woo, Dongseok Kwon, Young-Tak Seo, Jong-Ho Lee, Jong-Ho Bae
Publikováno v:
IEEE Transactions on Electron Devices. 69:832-837
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::323c890e03345d216433c89e9f3838a7
https://doi.org/10.1109/ted.2021.3134601
https://doi.org/10.1109/ted.2021.3134601
Autor:
Sung-Ho Park, Dongseok Kwon, Ho-Nam Yoo, Jong-Won Back, Joon Hwang, Yeongheon Yang, Jae-Joon Kim, Jong-Ho Lee
Publikováno v:
2022 International Electron Devices Meeting (IEDM).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3046460cbbaef0fbda123cb5d6837991
https://doi.org/10.1109/iedm45625.2022.10019529
https://doi.org/10.1109/iedm45625.2022.10019529
Publikováno v:
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::09026eb2841f2c2a660d67af74e87a15
https://doi.org/10.1109/vlsitechnologyandcir46769.2022.9830445
https://doi.org/10.1109/vlsitechnologyandcir46769.2022.9830445
Publikováno v:
Solid-State Electronics. 200:108570
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fbeda769f6cfa672b9cbc8343fee12ca
https://doi.org/10.1016/j.sse.2022.108570
https://doi.org/10.1016/j.sse.2022.108570