Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Ho Jae Shim"'
Autor:
Ho Jae Shim, Jin Seok Kim, Da Won Ahn, Jin Hyun Choe, Eunsu Jung, Donghyuk Oh, Kyung Soo Kim, Sung Chul Lee, Sung Gyu Pyo
Publikováno v:
Electronic Materials Letters. 18:321-329
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2f67fdc28b5681e161190b155631e0cb
https://doi.org/10.1007/s13391-022-00341-z
https://doi.org/10.1007/s13391-022-00341-z
Autor:
Sung Chul Lee, Sung Gyu Pyo, Jin Hyun Choe, Donghyuk Oh, Ho Jae Shim, Jin Seok Kim, Kyung Soo Kim, Won Da Ahn
Publikováno v:
Electronic Materials Letters. 17:362-368
High-performance transistors with high electron mobility and reliability are prerequisites to the design of next-generation displays. This has inspired many researchers to focus on oxide thin film transistors having excellent electrical and optical c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ea11a437d0e93f4ef8d8c81777610a07
https://doi.org/10.1007/s13391-021-00287-8
https://doi.org/10.1007/s13391-021-00287-8
Publikováno v:
Journal of Raman Spectroscopy. 50:571-575
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::80f1290eb7e649ecc2b96322d4710b02
https://doi.org/10.1002/jrs.5551
https://doi.org/10.1002/jrs.5551
Publikováno v:
Science of Advanced Materials. 9:2026-2031
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::76d40a09ca587804e36505a8c7706af2
https://doi.org/10.1166/sam.2017.3206
https://doi.org/10.1166/sam.2017.3206
Autor:
Sung Gyu Pyo, Areum Kim, Kang-Won Lee, EunMi Choi, Yuan Gao, Keunwon Kang, Yinhua Cui, Ho Jae Shim
Publikováno v:
Journal of Nanoscience and Nanotechnology. 17:7810-7813
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f54464ac0e995b5d4509e33c9636b31d
https://doi.org/10.1166/jnn.2017.14849
https://doi.org/10.1166/jnn.2017.14849
Autor:
Soon Hyeong Kwon, Yuan Gao, Yinhua Cui, Sung Gyu Pyo, Ho Jae Shim, Sang June Hahn, Eunmi Choi, Woo Suk Sul, Kang-Won Lee
Publikováno v:
Electronic Materials Letters. 13:230-234
We report the analysis of the radiofrequency (RF) characteristics according to the size, area, and shape of TaN thin-film resistor (TFR) layers. As the TFR size increased, its characteristics were degraded with increasing frequency owing to the incre
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::924351ef120c326e4394fcc23812c48b
https://doi.org/10.1007/s13391-017-1723-x
https://doi.org/10.1007/s13391-017-1723-x
Autor:
Yuan Gao, Sang June Hahn, Kang-Won Lee, Yinhua Cui, Longshou Zheng, Sung Gyu Pyo, Ho Jae Shim
Publikováno v:
Journal of nanoscience and nanotechnology. 19(3)
Electrochemical atomic force microscopy is a complex electrochemical analysis method that has been applied in many fields. Electrochemical atomic force microscopy consists of an electrochemical cell, electrochemical analysis system, and atomic force
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cc689e9ae5ee071d6cc77af4167e82ab
https://pubmed.ncbi.nlm.nih.gov/30469170
https://pubmed.ncbi.nlm.nih.gov/30469170