Zobrazeno 1 - 10
of 28
pro vyhledávání: '"Hitoshi Nohmi"'
Publikováno v:
2022 Asia-Pacific Microwave Conference (APMC).
Publikováno v:
2022 19th European Radar Conference (EuRAD).
Autor:
Hitoshi Nohmi, Ikuo Shirai
Publikováno v:
2021 IEEE Conference on Antenna Measurements & Applications (CAMA).
Publikováno v:
IGARSS
300 MHz X band FMCW single pass INSAR instrument and processing algorithm were developed for generating the accurate DEM of the Earth. Japan has more than hundred active volcanoes and often to vary the topography. This light weighted InSAR instrument
Autor:
Hitoshi Nohmi
Publikováno v:
2019 IEEE Radar Conference (RadarConf).
The development and application of vibration-imaging radar (VirA) is described in this paper. Microwave VirA is a 17-GHz FMCW imaging radar with 64-ch receiving units for digital beam-forming (DBF) processing. It is used to observe infrastructure suc
Publikováno v:
Journal of Japan Society of Civil Engineers, Ser. F3 (Civil Engineering Informatics). 77:II_16-II_22
Publikováno v:
Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2018.
The authors have developed a digital beam forming dynamic imaging radar system, ”VirA.” It is a cutting-edge non-contact measurement technology for space-continuous vibration monitoring of buildings. In this research, the authors have presented t
The remote-sensing technique microwave backscattering is known to be applied to determine various vegetation conditions, such as the growth of trees. However, the technology is mainly applied for studying geographic topologies from long distances, wi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::24b2c1cfecfcef45129d9d1db543b61e
Publikováno v:
Proceedings of SPIE; 1/26/2018, Vol. 10598, p1-10, 10p
Publikováno v:
IGARSS
A basic study for palm tree reflection characteristics was conducted by using different frequency bands including Ku-band, X-band and L-band antennas. Also different polarizations have been used such as HH, VV and HV to test its reflection properties