Zobrazeno 1 - 10
of 63
pro vyhledávání: '"Hitesh Shrimali"'
Publikováno v:
IEEE Open Journal of Nanotechnology, Vol 3, Pp 199-209 (2022)
The past decade has witnessed a tremendous reduction in the feature size from the deep-submicron to the advanced nano-scale CMOS devices. In nanoscale devices based high-speed systems, the budgeting of jitter due to supply fluctuations is one of the
Externí odkaz:
https://doaj.org/article/a7afa946f9b640cf96f8447f376d679d
Autor:
Muhammed Suhail Illikkal, Jai Narayan Tripathi, Vijender Kumar Sharma, Hitesh Shrimali, Ramachandra Achar
Publikováno v:
IEEE Access, Vol 10, Pp 100172-100177 (2022)
This paper presents novel observations and physical insights on jitter in a chain of CMOS inverters. It is demonstrated that at the final output of the inverter chain, power supply induced jitter does not necessarily increase with the number of inver
Externí odkaz:
https://doaj.org/article/0df8fb00fa0e45fe955c999cdc0ce51c
Autor:
Kumar Sambhav Pandey, Hitesh Shrimali
Publikováno v:
IEEE Access, Vol 10, Pp 56985-56995 (2022)
Parallelism is the key to enhancing the throughput of computing structures. However, it is well established that the presence of data-flow dependencies adversely impacts the exploitation of such parallelism. This paper presents a case for a new compu
Externí odkaz:
https://doaj.org/article/e3473fdebd7b4e768a11642d1f663c2e
Publikováno v:
IEEE Open Journal of Circuits and Systems, Vol 1, Pp 124-139 (2020)
This article presents two methods, the block approach indefinite admittance matrix (BA-IAM) and the estimation-by-inspection, to analyse the effects of deterministic noise on single-stage, single-ended amplifiers by extending the indefinite admittanc
Externí odkaz:
https://doaj.org/article/de5d4cf4c92240a69038db8ee0779ec5
Publikováno v:
IEEE Access, Vol 7, Pp 125240-125252 (2019)
This paper presents an efficient and generic method for analysis of power supply induced jitter (PSIJ) in a chain of CMOS inverters as well as tapered buffers due to multiple deterministic noise sources. Generalised semi-analytical relations between
Externí odkaz:
https://doaj.org/article/a918c943b9044f8aa3bb9f71bc12b062
Publikováno v:
IEEE Transactions on Electron Devices. 70:1520-1526
Autor:
Dinesh Kumar B., Hitesh Shrimali
Publikováno v:
Integration. 86:57-63
Publikováno v:
IEEE Transactions on Components, Packaging and Manufacturing Technology. 12:1130-1139
Autor:
Hitesh Shrimali, Kumar Sambhav Pandey
Publikováno v:
IEEE Access. 10:56985-56995