Sub-surface Imaging of Porous GaN Distributed Bragg Reflectors via Backscattered Electrons.

Autor: Sarkar M; Department of Materials Science and Metallurgy, University of Cambridge, Cambridge CB3 0FS, UK., Adams F; Department of Materials Science and Metallurgy, University of Cambridge, Cambridge CB3 0FS, UK., Dar SA; Department of Materials Science and Metallurgy, University of Cambridge, Cambridge CB3 0FS, UK., Penn J; Department of Physics, University of Oxford, Oxford OX1 3PJ, UK., Ji Y; Department of Materials Science and Metallurgy, University of Cambridge, Cambridge CB3 0FS, UK., Gundimeda A; Department of Materials Science and Metallurgy, University of Cambridge, Cambridge CB3 0FS, UK., Zhu T; Poro Technologies Ltd, Sawston CB22 3JH, UK., Liu C; IQE Europe Limited, Cardiff CF3 0LW, UK., Hirshy H; IQE Europe Limited, Cardiff CF3 0LW, UK., Massabuau FCP; Department of Physics, University of Strathcylde, Glasgow G4 0NG, UK., O'Hanlon T; Plymouth Electron Microscopy Center, University of Plymouth, Plymouth PL4 8AA, UK., Kappers MJ; Department of Materials Science and Metallurgy, University of Cambridge, Cambridge CB3 0FS, UK., Ghosh S; Department of Materials Science and Metallurgy, University of Cambridge, Cambridge CB3 0FS, UK., Kusch G; Department of Materials Science and Metallurgy, University of Cambridge, Cambridge CB3 0FS, UK., Oliver RA; Department of Materials Science and Metallurgy, University of Cambridge, Cambridge CB3 0FS, UK.

Publikováno v: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2024 Apr 29; Vol. 30 (2), pp. 208-225.

Micro and nano structuring of sapphire for micro injection process investigation

Autor: Bigot, S., Lacan, F., Hirshy, H., Petkov, P.V., Babenko, Maksims, Gonzalez Castro, Gabriela, Sweeney, John, Ugail, Hassan, Whiteside, Benjamin R.

The work presented in this paper contributes to a wider research objective aiming at gaining a better understanding of the injection moulding process at microscales. More specifically, it contributes to the development of a new modelling approach com

Externí odkaz: http://hdl.handle.net/10454/10608

Design and validation of a novel master-making process chain for organic and large area electronics on flexible substrates

Autor: Velkova, V., Lalev, G., Hirshy, H., Scholz, S., Hiitola-Keinänen, J., Gold, H., Haase, A., Hast, J., Stadlober, B., Dimov, S.

Publikováno v: In Microelectronic Engineering 2010 87(11):2139-2145

FIB sputtering optimization using Ion Reverse Software

Autor: Svintsov, A., Zaitsev, S., Lalev, G., Dimov, S., Velkova, V., Hirshy, H.

Publikováno v: In Microelectronic Engineering 2009 86(4):544-547

2 Period submicron grating at the inner wall of a metal cylinder.

Autor: Hirshy, H., Scholz, S., Jourlin, Y., Tonchev, S., Reynaud, S., Boukenter, A., Parriaux, O.

Publikováno v: Microsystem Technologies; Oct2014, Vol. 20 Issue 10/11, p1833-1837, 5p