Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Hirotaka Wakabayashi"'
Publikováno v:
Journal of the Ceramic Society of Japan. 110:408-415
Strontium titanate (SrTiO3) perovskite oxide thin films have been investigated for use as a dielectric material for by-pass (RF-shunt) capacitors in microwave monolithic integrated circuits (MMIC). This paper describes the structural and electrical f
Publikováno v:
Journal of the Ceramic Society of Japan. 110:86-91
SnO2 thin film heteroepitaxially grown on a rutile (100) TiO2 single crystal substrate exhibits high-density interfacial misfit dislocations and related planar defects. The misfit dislocation network formed on the heterointerface consists mainly of t
Publikováno v:
Journal of Materials Research. 13:2775-2778
Y–Ba–Cu–O films were prepared on yttria-stabilized zirconia polycrystalline substrate using KrF excimer laser irradiation with ethylene diamine tetra-acetic acid (EDTA) complexes as a target material. The results of the x-ray θ-2θ scan showed
Autor:
Norio Tanaka, Shigeo Ohshio, Hirotaka Wakabayashi, Hidetoshi Saitoh, Keizo Uematsu, Yoshiaki Takata
Publikováno v:
Materials Research Innovations. 2:39-44
YBa2Cu3O7 films were prepared by the new deposition technique ”complex beam epitaxy”. In this technique, metal-EDTA complexes are evaporated by excimer laser ablation. The metal-EDTA complexes are decomposed by heating on the single crystalline (
Autor:
Yimei Zhu, Shigeo Ohshio, Yacov Haimes, Wei Huang, Yanchun Zhou, Hans Conrad, Hirotaka Wakabayashi, Hidetoshi Saitoh, Yoshiaki Takata, Xiaochun Wu, Li Wang, Rongyao Wang, Norio Tanaka, Bingsuo Zou, Sishen Xie, S. Shimomsto, Qianwang Chen, A. J. Perrotta, Jay Switzer, Jiren Xu, Li Fei, Noriyuki Yamasaki, Keizo Uematsu
Publikováno v:
Materials Technology. 13:80-83
Publikováno v:
Japanese Journal of Applied Physics. 40:6081
Heteroepitaxal SnO2 thin films were grown on rutile (100) TiO2 single crystal substrates by pulsed laser deposition. The defect structure and surface morphology were investigated by transmission electron microscopy, reflection high-energy electron di