Zobrazeno 1 - 10
of 25
pro vyhledávání: '"Hirotaka Hosoi"'
Publikováno v:
Nanotechnology. 16:S102-S106
Based on topographic images of the GaAs(110) surface obtained by non-contact atomic force microscopy (NC-AFM) with different tip–sample distances, we discuss the tip–sample distance dependence of the cantilever vibration amplitude and the tip-ind
Publikováno v:
Nanotechnology. 15:S691-S698
We review our research on the application of scanning tunnelling microscopy (STM) and non-contact atomic force microscopy (NC-AFM) for magnetic imaging in high spatial resolution even down to the atomic scale. In the first part, we propose a new expe
Publikováno v:
Nanotechnology. 15:505-509
We investigated atomically resolved NC-AFM images of NiO(001) surfaces obtained with ferromagnetic Fe- and Ni-coated tips and bare Si tips. The cross-sections of atomically resolved images were analysed by adding the atomic corrugation amplitude on t
Publikováno v:
Nanotechnology. 15:S97-S100
Tip–sample interactions are at the origin of atomic resolution in non-contact atomic force microscopy (NC-AFM) but also make it difficult to understand the meaning of atomic features observed as NC-AFM images. (110) surfaces of III–V semiconducto
Publikováno v:
Japanese Journal of Applied Physics. 41:3092-3098
We present a new technique for the restoration of scanning tunneling microscopy (STM) images, which is a two-dimensional extension of a recently developed statistical approach based on the one-dimensional least-squares method (LSM). An STM image is r
Publikováno v:
Hyomen Kagaku. 23:158-165
Many kinds of scanning probe microscopes have been proposed for imaging surface magnetic structures. Theoretical calculations predict that the detection of the short-range magnetic interaction such as exchange interaction reveals the magnetic structu
Autor:
Hirotaka Hosoi, Agus Subagyo, Michiya Kimura, Koichi Mukasa, Kazuhisa Sueoka, Makoto Sawamura, Guido Eilers
Publikováno v:
Transactions of the Magnetics Society of Japan. 2:63-68
Publikováno v:
Applied Physics A. 72:S23-S26
We have observed a cleaved NiO(100) surface by means of non-contact atomic force microscopy (NC-AFM) using a Fe-coated tip. The shape and magnetic properties of the Fe-coated tip are confirmed by ex situ scanning electron microscopy (SEM) and magneti
Publikováno v:
Applied Surface Science. 157:218-221
We have observed the cleaved NiO(100) surface by means of the UHV non-contact atomic force microscopy (NC-AFM). Atomically resolved NC-AFM images of NiO(100)-cleaved surface has successfully obtained with atomically distinguishable defects at room te
Autor:
Hirotaka Hosoi, Motonori Nakamura, Agus Subagyo, Seiji Takeda, Koichi Mukasa, Atsushi Ishii, Kazuhisa Sueoka
Publikováno v:
Nanoscale Research Letters, Vol 2, Iss 4, Pp 207-212 (2007)
Nanoscale Research Letters
Nanoscale Research Letters
We fabricated a pH-sensitive device on a glass substrate based on properties of carbon nanotubes. Nanotubes were immobilized specifically on chemically modified areas on a substrate followed by deposition of metallic source and drain electrodes on th