Zobrazeno 1 - 10
of 205
pro vyhledávání: '"Hiroki Ishikuro"'
Autor:
Munehiro Tada, Koichiro Okamoto, Takahisa Tanaka, Makoto Miyamura, Hiroki Ishikuro, Ken Uchida, Toshitsugu Sakamoto
Publikováno v:
IEEE Journal of the Electron Devices Society, Vol 12, Pp 28-33 (2024)
A performance evaluation of cryogenic CMOS circuit at liquid-helium temperature (4.2K) is conducted using a standard 65nm bulk CMOS for quantum state controller (QSC) applications. The ON-current (Ion) of the core n/pMOSFET are increased by 25% and 9
Externí odkaz:
https://doaj.org/article/fc142c4856a64468bd3a3fd224789a5c
Publikováno v:
Applied Physics Express, Vol 17, Iss 5, p 051001 (2024)
MOS capacitors fabricated on substrates with doping concentrations as high as 10 ^18 cm ^−3 were characterized at 4.2 K. The highly doped substrate exhibited an intrinsic imaginary component of impedance at 4.2 K. The imaginary component is attribu
Externí odkaz:
https://doaj.org/article/5c5139f17c464f60aa0eda01ec275f02
Autor:
Shusuke Kawai, Takeshi Ueno, Hiroaki Ishihara, Satoshi Takaya, Koutaro Miyazaki, Kohei Onizuka, Hiroki Ishikuro
Publikováno v:
IEEE Transactions on Power Electronics. 38:7079-7091
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fadbfb28e1d55c3341f7aceeda411f9d
https://doi.org/10.1109/tpel.2023.3244200
https://doi.org/10.1109/tpel.2023.3244200
Autor:
Yohsuke Shiiki, Hiroki Ishikuro
Publikováno v:
IEEE Sensors Journal. 23:11746-11753
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7bc97f8cf5a87fb041df957f1130a488
https://doi.org/10.1109/jsen.2023.3265074
https://doi.org/10.1109/jsen.2023.3265074
Autor:
Tokihiko Shimura, Shun Sato, Taizo Tominaga, Shuma Abe, Kaoru Yamashita, Minoru Ashizawa, Takeo Kato, Hiroki Ishikuro, Naoji Matsuhisa
Publikováno v:
Advanced Materials Technologies.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ccc1489408073d5dd8bcbabcc445e782
https://doi.org/10.1002/admt.202201992
https://doi.org/10.1002/admt.202201992
Publikováno v:
2023 IEEE Custom Integrated Circuits Conference (CICC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::78039c2df39142145b50e60f5814b8c4
https://doi.org/10.1109/cicc57935.2023.10121320
https://doi.org/10.1109/cicc57935.2023.10121320
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 30:463-473
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::75e5fe4f91958739c64e0e0d7a487059
https://doi.org/10.1109/tvlsi.2022.3141909
https://doi.org/10.1109/tvlsi.2022.3141909
Autor:
Shinya Kajiyama, Yutaka Igarashi, Toru Yazaki, Yusaku Katsube, Takuma Nishimoto, Tatsuo Nakagawa, Yohei Nakamura, Yoshihiro Hayashi, Takuya Kaneko, Hiroki Ishikuro, Taizo Yamawaki
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 30:153-165
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::baaaf39aab8c3690ae87c71f870726e0
https://doi.org/10.1109/tvlsi.2021.3129313
https://doi.org/10.1109/tvlsi.2021.3129313
Autor:
Haruka Honda, Tsunaki Takahashi, Yohsuke Shiiki, Hao Zeng, Kentaro Nakamura, Shintaro Nagata, Takuro Hosomi, Wataru Tanaka, Guozhu Zhang, Masaki Kanai, Kazuki Nagashima, Hiroki Ishikuro, Takeshi Yanagida
Publikováno v:
ACS Sensors. 7:460-468
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::375d340e8a6138294b79e318f9a09a47
https://doi.org/10.1021/acssensors.1c02173
https://doi.org/10.1021/acssensors.1c02173
Autor:
Yi Tan, Hiroki Ishikuro
Publikováno v:
2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b4f80fc39d6e0dfaf1c7b855805e8a28
https://doi.org/10.1109/icecs202256217.2022.9971001
https://doi.org/10.1109/icecs202256217.2022.9971001