Zobrazeno 1 - 10
of 21
pro vyhledávání: '"Hiroki Date"'
Autor:
Sachio Suda, Kenichi Aoyagi, Yasutaka Sugano, Hiroto Takechi, Fumikazu Inuzuka, Hiroki Date, Soichiroh Usui
Publikováno v:
NTT Technical Review. 21:12-17
Autor:
Hiroshi Yamamoto, Kouhei Watanabe, Hiroki Date, Daisaku Shimazaki, Yutaka Fukuchi, Hideki Maeda
Publikováno v:
Optical Fiber Communication Conference (OFC) 2023.
We propose novel methodology to identify and localize soft-failures using performance metrics monitored at repeater nodes in addition to signal quality monitored at transponders and show feasibility in experiments using commercial equipment and field
Autor:
Hideki Maeda, Hiroki Date, Takeshi Kawasaki, Yasutaka Sugano, Hiroki Kawahara, Ito Ken, Daisaku Shimazaki, Takeshi Seki
Publikováno v:
NTT Technical Review. 19:59-64
Publikováno v:
IEEE Photonics Technology Letters. 33:649-651
A silent failure is a kind of failure that existing optical devices or equipment cannot detect although the failure actually happens. This failure makes it more difficult for maintenance operators to identify the fault point, which potentially deteri
Autor:
Yasuyuki Kajitani, Kazushige Kanda, Manabu Sato, Takahiro Shimizu, Hiroshi Sugawara, Junji Musha, Yee Lih Koh, Tomoki Nakagawa, Kazuaki Kawaguchi, Takahiro Sugimoto, Koji Hosono, Jumpei Sato, Mario Sako, Yusuke Ochi, Tomoaki Nakano, Katsuaki Sakurai, Ryo Fukuda, Ryoichi Tachibana, Naoki Kobayashi, Juan Lee, Hiroki Date, Hiroaki Nasu, Koichi Kawakami, Makoto Miakashi, Dai Nakamura, Yuuki Matsumoto, Jieyun Zhou, Shuo Chen, Tadashi Someya, Hiroshi Nakamura, Kosuke Yanagidaira, Namasivayam Raghunathan, Takeshi Ogawa, M. Kojima, Masami Masuda, Toshifumi Hashimoto, Jun Nakai, Takahisa Kawabe, Taira Shibuya, Masatsugu Ogawa, Osamu Nagao, Takahiro Yamashita, Teruo Takagiwa, Toshiki Hisada, Tomoharu Hashiguchi, Yasushi Nagadomi, Mizuki Uda, Noboru Shibata, Takatoshi Minamoto
Publikováno v:
IEEE Journal of Solid-State Circuits. 55:178-188
A 1.33-Tb 4-bit/cell quadruple-level (QLC) 3-D flash memory in a 96-word-line (WL)-layer technology that achieves 8.5 Gb/mm2 has been developed. This is the biggest capacity and the highest bit density ever reported. A source-bias-negative-sense with
Autor:
Siddhesh Darne, Teruo Takagiwa, Junya Matsuno, Yuki Shimizu, Naoya Tokiwa, Kei Shiraishi, Tetsuaki Utsumi, Hiroyuki Mizukoshi, Koji Hosono, Masatsugu Kojima, Junji Musha, Takuyo Kodama, Osamu Kobayashi, Masahiro Kano, Takeshi Hioka, Naoki Ookuma, Yuki Kuniyoshi, Takahiro Sugimoto, Ryoichi Tachibana, Hiroshi Sugawara, Hiroki Date, Kazuhide Yoneya, Srinivas Rajendra, Akira Arimizu, Yoshito Katano, Mitsuhiro Abe, Keiji Tsunoda, Masakazu Ehama, Toshifumi Hashimoto, Tianyu Tang, Tomofumi Fujimura, Ryo Fukuda, Jason Li, Hiroshi Maejima, Shintaro Hayashi, Akio Sugahara, Kei Akiyama, Koji Kato, Toru Miwa, Kensuke Yamamoto, Masahiro Yoshihara, Katsuaki Sakurai, Itaru Yamaguchi, Tsutomu Higuchi, Mizuki Kaneko, Jumpei Sato, Kazumasa Yamamoto, Yasuhiro Suematsu, Mitsuyuki Watanabe, Ryuji Yamashita, Venky Ramachandra, Kosuke Yanagidaira, Jiwang Lee, Kazuko Inuzuka, Hirotoshi Mori, Takatoshi Minamoto, Tomoharu Hashiguchi, Mitsuaki Honma, Juan Lee
Publikováno v:
ISSCC
This work demonstrates a novel 1Tb 3D Flash memory chip that has an area efficiency of 10.4Gb/mm2 in a 3b/cell technology. Using a circuit under array (CUA) design technique and over 170 word-line (WL) layers, the chip achieves 33% higher bit density
Autor:
Shohei Kamamura, Yoshihiko Uematsu, Hiroki Date, Rie Hayashi, Hiroshi Yamamoto, Aki Fukuda, Katsutoshi Koda
Publikováno v:
IEICE Transactions on Communications. :462-475
Autor:
Yoshihiko Uematsu, Takashi Miyamura, Rie Hayashi, Shohei Kamamura, Kouichi Genda, Hiroshi Yamamoto, Hiroki Date
Publikováno v:
IEICE Transactions on Communications. :122-130
Publikováno v:
IEICE Transactions on Communications. :2160-2170
Publikováno v:
ICC
We propose algorithms that uses fast graph mining for resolving the network topology to a locally regulated area defined as a component of network topology. Though the IP backbone network should be reconfigured periodically in accordance with environ