Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Hiroaki Ooe"'
Autor:
Hiroaki Ooe, Takashi Yokoyama
Publikováno v:
Physical Chemistry Chemical Physics (PCCP); 5/7/2024, Vol. 26 Issue 17, p12939-12946, 8p
Publikováno v:
The Journal of Physical Chemistry C. 127:7659-7665
Autor:
Hiroaki Ooe, Toyoko Arai
Publikováno v:
Applied Physics Express. 12:115002
Autor:
Daniel S. Wastl, Hiroaki Ooe, Franz J. Giessibl, Alfred J. Weymouth, Toyoko Arai, Dominik Kirpal
In bimodal FM-AFM, two flexural modes are excited simultaneously. The total vertical oscillation deflection range of the tip is the sum of the peak-to-peak amplitudes of both flexural modes (sum amplitude). We show atomically resolved images of KBr(1
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e774ee2d4a18d860ff4a78a2ac7cd356
https://epub.uni-regensburg.de/34861/
https://epub.uni-regensburg.de/34861/
Publikováno v:
The Review of scientific instruments. 87(2)
High-Q factor retuned fork (RTF) force sensors made from quartz tuning forks, and the electric circuits for the sensors, were evaluated and optimized to improve the performance of non-contact atomic force microscopy (nc-AFM) performed under ultrahigh
Autor:
Hiroaki Ooe, Kirpal, Dominik, Wastl, Daniel S., Weymouth, Alfred J., Toyoko Arai, Giessibl, Franz J.
Publikováno v:
Applied Physics Letters; 10/3/2016, Vol. 109 Issue 14, p1-4, 4p, 1 Diagram, 2 Graphs
Publikováno v:
Applied Physics Letters. 105:043107
Based on a two-prong type quartz tuning fork, a force sensor with a high Q factor, which we call a retuned fork sensor, was developed for non-contact atomic force microscopy (nc-AFM) with atomic resolution. By cutting a small notch and attaching an A